TY - JOUR
T1 - Anodic Oxides on Hg1-xCdxTe Studied Using Angle and X-Ray Power-Dependent X-Ray Photoelectron Spectroscopy
AU - Shimanoe, Kengo
AU - Sakashita, Masao
PY - 1992/7
Y1 - 1992/7
N2 - The surface composition of the anodic oxidation film on Hg0.8Cd0.2Te (MCT) has been studied by means of angle and X-ray power-dependent X-ray photoelectron spectroscopy (XPS) techniques. The anodic oxidation film is composed of oxides and hydroxides, in which a tellurium oxide with a low valence is involved. The hydroxides are more predominant in the outermost layer. The low valence oxide (Te2+) is changed to a high valence oxide (Te4+) with X-ray power higher than 40 W. Furthermore, such high-power irradiation induces evaporation of mercury oxides and/or hydroxides and conversion of hydroxides to oxides. These changes are observed also in the spectrum obtained under monochromatized X-ray irradiation.
AB - The surface composition of the anodic oxidation film on Hg0.8Cd0.2Te (MCT) has been studied by means of angle and X-ray power-dependent X-ray photoelectron spectroscopy (XPS) techniques. The anodic oxidation film is composed of oxides and hydroxides, in which a tellurium oxide with a low valence is involved. The hydroxides are more predominant in the outermost layer. The low valence oxide (Te2+) is changed to a high valence oxide (Te4+) with X-ray power higher than 40 W. Furthermore, such high-power irradiation induces evaporation of mercury oxides and/or hydroxides and conversion of hydroxides to oxides. These changes are observed also in the spectrum obtained under monochromatized X-ray irradiation.
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U2 - 10.1143/JJAP.31.2066
DO - 10.1143/JJAP.31.2066
M3 - Article
AN - SCOPUS:0026897563
SN - 0021-4922
VL - 31
SP - 2066
EP - 2070
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 7 R
ER -