Silicon crystals have been examined at low temperatures by high-angle double-crystal X-ray diffractometry (HADOX). By a new experimental procedure named 2θ-resolved HADOX, the change in the lattice spacing and that in the crystal orientation are independently determined. Diffraction for a region without or with stresses has been examined on specimen crystals in a special form. It is found that the silicon crystal shows normal behaviour on both cooling and heating when it is stress free. With stresses, anomalies are found around 210 K on cooling.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)