TY - JOUR
T1 - Applicability of the differential X-ray absorption method to the determinations of foil thickness and local composition in the analytical electron microscope
AU - Horita, Z.
AU - Ichitani, K.
AU - Sano, T.
AU - Nemoto, M.
N1 - Funding Information:
ACKNOWLEDGMENTS This research was supported by Grant-in-Aid 62460195 for Scientific Research from the Ministry of Education, Science and Culture of'Japan, by the Iron and Steel Institute of Japan, and by the Kazato Research Foundation. An analytical electron microscope (JEM-2000FX) in the High-Voltage Electron Microscopy Laboratory of Kyushu University was used to obtain the present X-ray data.
PY - 1989/5
Y1 - 1989/5
N2 - In this paper, we examine the applicability of the differential X-ray absorption (DXA) method of Morris, Ball and Statham which is capable of determining foil thickness and local composition concurrently in an analytical electron microscope. The method is first modified to take a general form where the thickness determination is achieved with a pair of characteristic lines from different elements. When this form is used, the pair is not necessarily limited from the same elements. It is shown then that there are four important factors affecting the precision and accuracy of the foil thickness. A comparison is carried out between the thicknesses determined with the DXA method and those measured with the convergent-beam electron diffraction method. The composition analysed with the DXA method is also compared with the nominal composition of the sample.
AB - In this paper, we examine the applicability of the differential X-ray absorption (DXA) method of Morris, Ball and Statham which is capable of determining foil thickness and local composition concurrently in an analytical electron microscope. The method is first modified to take a general form where the thickness determination is achieved with a pair of characteristic lines from different elements. When this form is used, the pair is not necessarily limited from the same elements. It is shown then that there are four important factors affecting the precision and accuracy of the foil thickness. A comparison is carried out between the thicknesses determined with the DXA method and those measured with the convergent-beam electron diffraction method. The composition analysed with the DXA method is also compared with the nominal composition of the sample.
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U2 - 10.1080/01418618908209829
DO - 10.1080/01418618908209829
M3 - Article
AN - SCOPUS:0024667728
SN - 0141-8610
VL - 59
SP - 939
EP - 952
JO - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
JF - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
IS - 5
ER -