TY - JOUR
T1 - Application of ζ-factor method to Ti-Al-Cr system in analytical electron microscopy
AU - Tanaka, Satoru
AU - Watanabe, Masashi
AU - Horita, Zenji
AU - Nemoto, Minoru
N1 - Funding Information:
Thisworkwas supported by a Gram-in-Aid for Scientific Research from the Ministry of Education, Science, Sports and Culture of Japan. Electron
PY - 1998
Y1 - 1998
N2 - This study presents quantitative microanalysis of the Ti-Al-Cr system using analytical electron microscopy. The absorption correction is made using the ζ-factor method developed recently, which does not require knowledge of thickness nor density at the point of analysis. A brief summary of the method is given to illustrate the process for simultaneous determination of the composition and thickness at the point of analysis. It is demonstrated that the ζ-factor method is applicable to the ternary Ti-Al-Cr system.
AB - This study presents quantitative microanalysis of the Ti-Al-Cr system using analytical electron microscopy. The absorption correction is made using the ζ-factor method developed recently, which does not require knowledge of thickness nor density at the point of analysis. A brief summary of the method is given to illustrate the process for simultaneous determination of the composition and thickness at the point of analysis. It is demonstrated that the ζ-factor method is applicable to the ternary Ti-Al-Cr system.
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U2 - 10.1093/oxfordjournals.jmicro.a023564
DO - 10.1093/oxfordjournals.jmicro.a023564
M3 - Article
AN - SCOPUS:0031945048
SN - 2050-5698
VL - 47
SP - 9
EP - 15
JO - Microscopy (Oxford, England)
JF - Microscopy (Oxford, England)
IS - 1
ER -