Application of a laboratory xafs spectrometer to characterization of aluminium in an amorphous aluminosilicate

Yoshio Ikeda, Takushi Yokoyama, Seiichi Yamashita, Hisanobu Wakita

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Using a Laboratory XAFS(X-ray absorption fine structure) spectrometer, the local structure of aluminium in an aluminosilicate with a Si/Al atomic ratio of 1/3 was studied. From the XAFS data, the average Al-0 interatomic distance and coordination number of aluminium atoms were estimated. In addition, the assignment of the XANES(X-ray absorption nearedge structure) spectra for aluminium was discussed based on the27A1 MAS NMR spectra of the corresponding samples.

Original languageEnglish
Pages (from-to)670-672
Number of pages3
JournalJapanese journal of applied physics
Volume32
DOIs
Publication statusPublished - Jan 1993

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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