Application of a laboratory xafs spectrometer to characterization of aluminium in an amorphous aluminosilicate

Yoshio Ikeda, Takushi Yokoyama, Seiichi Yamashita, Hisanobu Wakita

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Using a Laboratory XAFS(X-ray absorption fine structure) spectrometer, the local structure of aluminium in an aluminosilicate with a Si/Al atomic ratio of 1/3 was studied. From the XAFS data, the average Al-0 interatomic distance and coordination number of aluminium atoms were estimated. In addition, the assignment of the XANES(X-ray absorption nearedge structure) spectra for aluminium was discussed based on the27A1 MAS NMR spectra of the corresponding samples.

Original languageEnglish
Pages (from-to)670-672
Number of pages3
JournalJapanese Journal of Applied Physics
Volume32
DOIs
Publication statusPublished - Jan 1993

Fingerprint

Aluminosilicates
X ray absorption
Spectrometers
spectrometers
aluminum
Aluminum
fine structure
x rays
coordination number
Nuclear magnetic resonance
Atoms
nuclear magnetic resonance
atoms

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Application of a laboratory xafs spectrometer to characterization of aluminium in an amorphous aluminosilicate. / Ikeda, Yoshio; Yokoyama, Takushi; Yamashita, Seiichi; Wakita, Hisanobu.

In: Japanese Journal of Applied Physics, Vol. 32, 01.1993, p. 670-672.

Research output: Contribution to journalArticle

Ikeda, Yoshio ; Yokoyama, Takushi ; Yamashita, Seiichi ; Wakita, Hisanobu. / Application of a laboratory xafs spectrometer to characterization of aluminium in an amorphous aluminosilicate. In: Japanese Journal of Applied Physics. 1993 ; Vol. 32. pp. 670-672.
@article{ab32f257607540bdab975dc8fe391411,
title = "Application of a laboratory xafs spectrometer to characterization of aluminium in an amorphous aluminosilicate",
abstract = "Using a Laboratory XAFS(X-ray absorption fine structure) spectrometer, the local structure of aluminium in an aluminosilicate with a Si/Al atomic ratio of 1/3 was studied. From the XAFS data, the average Al-0 interatomic distance and coordination number of aluminium atoms were estimated. In addition, the assignment of the XANES(X-ray absorption nearedge structure) spectra for aluminium was discussed based on the27A1 MAS NMR spectra of the corresponding samples.",
author = "Yoshio Ikeda and Takushi Yokoyama and Seiichi Yamashita and Hisanobu Wakita",
year = "1993",
month = "1",
doi = "10.7567/JJAPS.32S2.670",
language = "English",
volume = "32",
pages = "670--672",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Institute of Physics",

}

TY - JOUR

T1 - Application of a laboratory xafs spectrometer to characterization of aluminium in an amorphous aluminosilicate

AU - Ikeda, Yoshio

AU - Yokoyama, Takushi

AU - Yamashita, Seiichi

AU - Wakita, Hisanobu

PY - 1993/1

Y1 - 1993/1

N2 - Using a Laboratory XAFS(X-ray absorption fine structure) spectrometer, the local structure of aluminium in an aluminosilicate with a Si/Al atomic ratio of 1/3 was studied. From the XAFS data, the average Al-0 interatomic distance and coordination number of aluminium atoms were estimated. In addition, the assignment of the XANES(X-ray absorption nearedge structure) spectra for aluminium was discussed based on the27A1 MAS NMR spectra of the corresponding samples.

AB - Using a Laboratory XAFS(X-ray absorption fine structure) spectrometer, the local structure of aluminium in an aluminosilicate with a Si/Al atomic ratio of 1/3 was studied. From the XAFS data, the average Al-0 interatomic distance and coordination number of aluminium atoms were estimated. In addition, the assignment of the XANES(X-ray absorption nearedge structure) spectra for aluminium was discussed based on the27A1 MAS NMR spectra of the corresponding samples.

UR - http://www.scopus.com/inward/record.url?scp=33748410101&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33748410101&partnerID=8YFLogxK

U2 - 10.7567/JJAPS.32S2.670

DO - 10.7567/JJAPS.32S2.670

M3 - Article

AN - SCOPUS:33748410101

VL - 32

SP - 670

EP - 672

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

ER -