X-ray microanalysis using an analytical electron microscope is applied to diifusivity measurements in an alloy system where the X-ray absorption correction is imperative. It is shown that the differential X-ray absorption (DXA) method is useful for the absorption correction in the determination of a concentration gradient across a diffusion couple interface.
|Number of pages||6|
|Journal||Philosophical Magazine Letters|
|Publication status||Published - Nov 1990|
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics