Application of analytical electron microscopy to diifusivity measurement requiring X-ray absorption correction

Z. Horita; I. Yoshinaga; T. Fujinami; T. Sano; M. Nemoto

doi:10.1080/09500839008215157

Application of analytical electron microscopy to diifusivity measurement requiring X-ray absorption correction

Z. Horita, I. Yoshinaga, T. Fujinami, T. Sano, M. Nemoto

Research output: Contribution to journal › Article › peer-review

Abstract

X-ray microanalysis using an analytical electron microscope is applied to diifusivity measurements in an alloy system where the X-ray absorption correction is imperative. It is shown that the differential X-ray absorption (DXA) method is useful for the absorption correction in the determination of a concentration gradient across a diffusion couple interface.

Original language	English
Pages (from-to)	365-370
Number of pages	6
Journal	Philosophical Magazine Letters
Volume	62
Issue number	5
DOIs	https://doi.org/10.1080/09500839008215157
Publication status	Published - Nov 1990

All Science Journal Classification (ASJC) codes

Condensed Matter Physics

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10.1080/09500839008215157

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@article{5247fe10fb2a411b9a335f073e4409fb,

title = "Application of analytical electron microscopy to diifusivity measurement requiring X-ray absorption correction",

abstract = "X-ray microanalysis using an analytical electron microscope is applied to diifusivity measurements in an alloy system where the X-ray absorption correction is imperative. It is shown that the differential X-ray absorption (DXA) method is useful for the absorption correction in the determination of a concentration gradient across a diffusion couple interface.",

author = "Z. Horita and I. Yoshinaga and T. Fujinami and T. Sano and M. Nemoto",

note = "Funding Information: ACKNOWLEDGMENTS This work was supported in part by Ishihara-Asada Research Fund in the Iron and Steel Institute of Japan. An analytical electron microscope (JEM-2000FX)i n the High-Voltage Electron Microscopy Laboratory of Kyushu University was used to obtain the present results. Copyright: Copyright 2016 Elsevier B.V., All rights reserved.",

year = "1990",

month = nov,

doi = "10.1080/09500839008215157",

language = "English",

volume = "62",

pages = "365--370",

journal = "Philosophical Magazine Letters",

issn = "0950-0839",

publisher = "Taylor and Francis Ltd.",

number = "5",

}

TY - JOUR

T1 - Application of analytical electron microscopy to diifusivity measurement requiring X-ray absorption correction

AU - Horita, Z.

AU - Yoshinaga, I.

AU - Fujinami, T.

AU - Sano, T.

AU - Nemoto, M.

N1 - Funding Information: ACKNOWLEDGMENTS This work was supported in part by Ishihara-Asada Research Fund in the Iron and Steel Institute of Japan. An analytical electron microscope (JEM-2000FX)i n the High-Voltage Electron Microscopy Laboratory of Kyushu University was used to obtain the present results. Copyright: Copyright 2016 Elsevier B.V., All rights reserved.

PY - 1990/11

Y1 - 1990/11

N2 - X-ray microanalysis using an analytical electron microscope is applied to diifusivity measurements in an alloy system where the X-ray absorption correction is imperative. It is shown that the differential X-ray absorption (DXA) method is useful for the absorption correction in the determination of a concentration gradient across a diffusion couple interface.

AB - X-ray microanalysis using an analytical electron microscope is applied to diifusivity measurements in an alloy system where the X-ray absorption correction is imperative. It is shown that the differential X-ray absorption (DXA) method is useful for the absorption correction in the determination of a concentration gradient across a diffusion couple interface.

UR - http://www.scopus.com/inward/record.url?scp=0011854608&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0011854608&partnerID=8YFLogxK

U2 - 10.1080/09500839008215157

DO - 10.1080/09500839008215157

M3 - Article

AN - SCOPUS:0011854608

SN - 0950-0839

VL - 62

SP - 365

EP - 370

JO - Philosophical Magazine Letters

JF - Philosophical Magazine Letters

IS - 5

ER -

Application of analytical electron microscopy to diifusivity measurement requiring X-ray absorption correction

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