Application of analytical electron microscopy to diifusivity measurement requiring X-ray absorption correction

Z. Horita, I. Yoshinaga, T. Fujinami, T. Sano, M. Nemoto

    Research output: Contribution to journalArticlepeer-review

    5 Citations (Scopus)

    Abstract

    X-ray microanalysis using an analytical electron microscope is applied to diifusivity measurements in an alloy system where the X-ray absorption correction is imperative. It is shown that the differential X-ray absorption (DXA) method is useful for the absorption correction in the determination of a concentration gradient across a diffusion couple interface.

    Original languageEnglish
    Pages (from-to)365-370
    Number of pages6
    JournalPhilosophical Magazine Letters
    Volume62
    Issue number5
    DOIs
    Publication statusPublished - Nov 1990

    All Science Journal Classification (ASJC) codes

    • Condensed Matter Physics

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