Application of analytical electron microscopy to diifusivity measurement requiring X-ray absorption correction

Zenji Horita, I. Yoshinaga, T. Fujinami, T. Sano, M. Nemoto

Research output: Contribution to journalArticle

5 Citations (Scopus)


X-ray microanalysis using an analytical electron microscope is applied to diifusivity measurements in an alloy system where the X-ray absorption correction is imperative. It is shown that the differential X-ray absorption (DXA) method is useful for the absorption correction in the determination of a concentration gradient across a diffusion couple interface.

Original languageEnglish
Pages (from-to)365-370
Number of pages6
JournalPhilosophical Magazine Letters
Issue number5
Publication statusPublished - Jan 1 1990


All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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