APPLICATION OF ATOM PROBE-FIELD ION MICROSCOPE TO FERROUS MATERIALS.

Ryuji Uemori, Mitsuru Tanino

Research output: Contribution to journalArticle

Abstract

The atom probe-field ion microscope (N-FIM) facilitates observation of atomic arrangement in the specimen surface with high resolution and identification of species of individual atoms by high-sensitivity mass spectroscopy. The AP-FIM produced detailed knowledge on such small specimen regions that could not be clearly analyzed by conventional electron microscopy. The principle of the AP-FIM is explained, and the results of AP-FIM analysis of ultra-fine precipitates formed at the peak stage of secondary hardening in a tempered Mo steel is briefly described.

Original languageEnglish
Pages (from-to)48-54
Number of pages7
JournalNippon Steel Technical Report
Issue number33
Publication statusPublished - Apr 1987
Externally publishedYes

Fingerprint

Ion microscopes
Atoms
Steel
Electron microscopy
Hardening
Precipitates
Spectroscopy

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Metals and Alloys
  • Materials Chemistry

Cite this

APPLICATION OF ATOM PROBE-FIELD ION MICROSCOPE TO FERROUS MATERIALS. / Uemori, Ryuji; Tanino, Mitsuru.

In: Nippon Steel Technical Report, No. 33, 04.1987, p. 48-54.

Research output: Contribution to journalArticle

@article{8e40405ceed943ae98afa3d22c27eecf,
title = "APPLICATION OF ATOM PROBE-FIELD ION MICROSCOPE TO FERROUS MATERIALS.",
abstract = "The atom probe-field ion microscope (N-FIM) facilitates observation of atomic arrangement in the specimen surface with high resolution and identification of species of individual atoms by high-sensitivity mass spectroscopy. The AP-FIM produced detailed knowledge on such small specimen regions that could not be clearly analyzed by conventional electron microscopy. The principle of the AP-FIM is explained, and the results of AP-FIM analysis of ultra-fine precipitates formed at the peak stage of secondary hardening in a tempered Mo steel is briefly described.",
author = "Ryuji Uemori and Mitsuru Tanino",
year = "1987",
month = "4",
language = "English",
pages = "48--54",
journal = "Nippon Steel Technical Report",
issn = "0300-306X",
publisher = "Nippon Steel Corporation",
number = "33",

}

TY - JOUR

T1 - APPLICATION OF ATOM PROBE-FIELD ION MICROSCOPE TO FERROUS MATERIALS.

AU - Uemori, Ryuji

AU - Tanino, Mitsuru

PY - 1987/4

Y1 - 1987/4

N2 - The atom probe-field ion microscope (N-FIM) facilitates observation of atomic arrangement in the specimen surface with high resolution and identification of species of individual atoms by high-sensitivity mass spectroscopy. The AP-FIM produced detailed knowledge on such small specimen regions that could not be clearly analyzed by conventional electron microscopy. The principle of the AP-FIM is explained, and the results of AP-FIM analysis of ultra-fine precipitates formed at the peak stage of secondary hardening in a tempered Mo steel is briefly described.

AB - The atom probe-field ion microscope (N-FIM) facilitates observation of atomic arrangement in the specimen surface with high resolution and identification of species of individual atoms by high-sensitivity mass spectroscopy. The AP-FIM produced detailed knowledge on such small specimen regions that could not be clearly analyzed by conventional electron microscopy. The principle of the AP-FIM is explained, and the results of AP-FIM analysis of ultra-fine precipitates formed at the peak stage of secondary hardening in a tempered Mo steel is briefly described.

UR - http://www.scopus.com/inward/record.url?scp=0023325718&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023325718&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0023325718

SP - 48

EP - 54

JO - Nippon Steel Technical Report

JF - Nippon Steel Technical Report

SN - 0300-306X

IS - 33

ER -