APPLICATION OF ATOM PROBE-FIELD ION MICROSCOPE TO FERROUS MATERIALS.

Ryuji Uemori, Mitsuru Tanino

Research output: Contribution to journalArticlepeer-review

Abstract

The atom probe-field ion microscope (N-FIM) facilitates observation of atomic arrangement in the specimen surface with high resolution and identification of species of individual atoms by high-sensitivity mass spectroscopy. The AP-FIM produced detailed knowledge on such small specimen regions that could not be clearly analyzed by conventional electron microscopy. The principle of the AP-FIM is explained, and the results of AP-FIM analysis of ultra-fine precipitates formed at the peak stage of secondary hardening in a tempered Mo steel is briefly described.

Original languageEnglish
Pages (from-to)48-54
Number of pages7
JournalNippon Steel Technical Report
Issue number33
Publication statusPublished - Apr 1 1987
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Metals and Alloys
  • Materials Chemistry

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