Abstract
Metastable long-period superstructures in an LI0-TiAl single crystal with a composition gradient were observed successfully by transmission electron microscopy with a focused ion beam (FIB) microsampling technique. The composition gradient from 54.7 to 75 at.% Al with ∼6 μm width was detected by electron probe microanalysis and foil specimens containing the composition-gradient area were fabricated by the FIB microsampling method. The foil specimens clearly exhibit sequential changes in long-period superstructure depending on the Al concentration.
| Original language | English |
|---|---|
| Pages (from-to) | 537-540 |
| Number of pages | 4 |
| Journal | Journal of Electron Microscopy |
| Volume | 53 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 2004 |
All Science Journal Classification (ASJC) codes
- Instrumentation
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Hata, S., Shiraishi, K., Itakura, M., Kuwano, N., Nakano, T., & Umakoshi, Y. (2004). Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient. Journal of Electron Microscopy, 53(5), 537-540. https://doi.org/10.1093/jmicro/dfh049