@article{7ded4267764b445cb9f260b04cace35f,
title = "Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient",
abstract = "Metastable long-period superstructures in an LI0-TiAl single crystal with a composition gradient were observed successfully by transmission electron microscopy with a focused ion beam (FIB) microsampling technique. The composition gradient from 54.7 to 75 at.% Al with ∼6 μm width was detected by electron probe microanalysis and foil specimens containing the composition-gradient area were fabricated by the FIB microsampling method. The foil specimens clearly exhibit sequential changes in long-period superstructure depending on the Al concentration.",
author = "Satoshi Hata and Kohjiro Shiraishi and Masaru Itakura and Noriyuki Kuwano and Takayoshi Nakano and Yukichi Umakoshi",
note = "Funding Information: This work was partly supported by (i) a Grant-in-Aid for Young Scientists (B) (15710092) from the Ministry of Education, Culture, Sports, Science and Technology (MEXT), (ii) the Kyushu University High Voltage Electron Microscopy Program for Nano-materials Development of the MEXT Nanotechnology Researchers Network and (iii) Priority Assistance of the Formation of Worldwide Renowned Centers of Research – the 21st Century COE Program (project: Center of Excellence for Advanced Structural and Functional Materials Design) from the MEXT. This work was also partly carried out at the Strategic Research Base {\textquoteleft}Handai Frontier Research Center{\textquoteright} supported by the Japanese Government{\textquoteright}s Special Coordination Fund for Promoting Science and Technology.",
year = "2004",
doi = "10.1093/jmicro/dfh049",
language = "English",
volume = "53",
pages = "537--540",
journal = "Microscopy (Oxford, England)",
issn = "2050-5698",
publisher = "Japanese Society of Microscopy",
number = "5",
}