Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient

Satoshi Hata, Kohjiro Shiraishi, Masaru Itakura, Noriyuki Kuwano, Takayoshi Nakano, Yukichi Umakoshi

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Metastable long-period superstructures in an LI0-TiAl single crystal with a composition gradient were observed successfully by transmission electron microscopy with a focused ion beam (FIB) microsampling technique. The composition gradient from 54.7 to 75 at.% Al with ∼6 μm width was detected by electron probe microanalysis and foil specimens containing the composition-gradient area were fabricated by the FIB microsampling method. The foil specimens clearly exhibit sequential changes in long-period superstructure depending on the Al concentration.

Original languageEnglish
Pages (from-to)537-540
Number of pages4
JournalJournal of Electron Microscopy
Volume53
Issue number5
DOIs
Publication statusPublished - 2004

All Science Journal Classification (ASJC) codes

  • Instrumentation

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