Application of laser ablation atomic fluorescence spectroscopy for nanometer solid surface analysis

M. K. Kim, H. Ishii, K. Taoka, Y. Oki, M. Maeda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Laser ablation is well established as a tool for surface processing. Various types of materials ranging from polymers to inorganic crystals and metals have been extensively studied. Laser-induced ablation of solid surface makes an accurate vaporization of the surface possible, and most of the species in the ablation plume are in the atomic state. We have developed an extremely sensitive atomic detection method called LAAF (Laser Ablation Atomic Fluorescence) spectroscopy. In LAAF spectroscopy, the ablation was used to atomize the sample surface, and atoms in the ablation plume were detected by laser-induced fluorescence (LIF) spectroscopy. In the detection of Na atoms in pure water, we had acquired the limit of detection such as 0.6 fg for signal-to-noise ratio (SIN) as unity. This LAAF spectroscopy is one of the most sensitive techniques in trace element analysis, and is presently applied to solid surface analysis. In the work, LAAF spectroscopy is applied for nanometer solid surface analysis of Na-doped poly-methylmethacrylate (PMMA). The analysis is also extended to silicon and different metals.

Original languageEnglish
Title of host publicationCLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1194-1195
Number of pages2
ISBN (Electronic)0780356616, 9780780356610
DOIs
Publication statusPublished - Jan 1 1999
Event1999 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 1999 - Seoul, Korea, Republic of
Duration: Aug 30 1999Sep 3 1999

Publication series

NameCLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics
Volume4

Other

Other1999 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 1999
CountryKorea, Republic of
CitySeoul
Period8/30/999/3/99

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Networks and Communications
  • Physics and Astronomy(all)

Cite this

Kim, M. K., Ishii, H., Taoka, K., Oki, Y., & Maeda, M. (1999). Application of laser ablation atomic fluorescence spectroscopy for nanometer solid surface analysis. In CLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics (pp. 1194-1195). [814731] (CLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics; Vol. 4). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.1999.814731