The transient reflecting grating method has been used to characterize ion-implanted silicon layers and demonstrate its usefulness for nondestructive and remote evaluation of modified solid surfaces. The surface acoustic velocity, relaxation constant and signal intensity were measured as functions of ion dose. The results suggested that damage induced by implantation significantly affected the surface properties even under light dose conditions. The subnanosecond temporal resolution of the present method provided successful characterization of the implanted layers.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)