TY - GEN
T1 - Application of the quantitative-phase and crystal-structure simultaneous analysis to the X-ray diffraction data obtained by synchrotron gandolfi camera system
AU - Tanaka, Masahiko
AU - Nakamura, Tomoki
AU - Noguchi, Takaaki
PY - 2007/3/26
Y1 - 2007/3/26
N2 - Quantitative-phase and crystal-structure simultaneous analysis method has been successfully developed by applying the multi-phase Rietveld refinement to the diffraction data obtained by synchrotron Gandolfi camera system. This newly developed analytical method has been applied to diffraction experiments with micro-amount extraterrestrial samples, which the diameter is a hundred micrometers or less, and the mineral composition ratio of crystalline phase included in the sample has been successfully determined. As the crystal structure is also refined in Rietveld analysis by this method, the structural information of each mineral phase are simultaneously obtained. This method is a totally non-distractive quantitative-phase analysis method and will be a new and unique analytical method for planetary material science.
AB - Quantitative-phase and crystal-structure simultaneous analysis method has been successfully developed by applying the multi-phase Rietveld refinement to the diffraction data obtained by synchrotron Gandolfi camera system. This newly developed analytical method has been applied to diffraction experiments with micro-amount extraterrestrial samples, which the diameter is a hundred micrometers or less, and the mineral composition ratio of crystalline phase included in the sample has been successfully determined. As the crystal structure is also refined in Rietveld analysis by this method, the structural information of each mineral phase are simultaneously obtained. This method is a totally non-distractive quantitative-phase analysis method and will be a new and unique analytical method for planetary material science.
UR - http://www.scopus.com/inward/record.url?scp=33947396682&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33947396682&partnerID=8YFLogxK
U2 - 10.1063/1.2436414
DO - 10.1063/1.2436414
M3 - Conference contribution
AN - SCOPUS:33947396682
SN - 0735403732
SN - 9780735403734
T3 - AIP Conference Proceedings
SP - 1779
EP - 1783
BT - SYNCHROTRON RADIATION INSTRUMENTATION
T2 - SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
Y2 - 28 May 2006 through 28 June 2006
ER -