Application of the quantitative-phase and crystal-structure simultaneous analysis to the X-ray diffraction data obtained by synchrotron gandolfi camera system

Masahiko Tanaka, Tomoki Nakamura, Takaaki Noguchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Quantitative-phase and crystal-structure simultaneous analysis method has been successfully developed by applying the multi-phase Rietveld refinement to the diffraction data obtained by synchrotron Gandolfi camera system. This newly developed analytical method has been applied to diffraction experiments with micro-amount extraterrestrial samples, which the diameter is a hundred micrometers or less, and the mineral composition ratio of crystalline phase included in the sample has been successfully determined. As the crystal structure is also refined in Rietveld analysis by this method, the structural information of each mineral phase are simultaneously obtained. This method is a totally non-distractive quantitative-phase analysis method and will be a new and unique analytical method for planetary material science.

Original languageEnglish
Title of host publicationSYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publicationNinth International Conference on Synchrotron Radiation Instrumentation
Pages1779-1783
Number of pages5
DOIs
Publication statusPublished - Mar 26 2007
Externally publishedYes
EventSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
Duration: May 28 2006Jun 28 2006

Publication series

NameAIP Conference Proceedings
Volume879
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
CountryKorea, Republic of
CityDaegu
Period5/28/066/28/06

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Tanaka, M., Nakamura, T., & Noguchi, T. (2007). Application of the quantitative-phase and crystal-structure simultaneous analysis to the X-ray diffraction data obtained by synchrotron gandolfi camera system. In SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation (pp. 1779-1783). (AIP Conference Proceedings; Vol. 879). https://doi.org/10.1063/1.2436414