Application of three-dimensional electron tomography using bright-field imaging-Two types of Si-phases in Al-Si alloy

Kenji Kaneko, Ryo Nagayama, Koji Inoke, Etsuko Noguchi, Zenji Horita

    Research output: Contribution to journalArticlepeer-review

    6 Citations (Scopus)

    Abstract

    When a dilute amount of Si is added to Al, it results in the precipitation of Si-phases, either planar- and/or rod-type, depending on the ageing conditions. Observation of these phases had been carried out by TEM two dimensionally so far; nevertheless information of the thickness as well as the distribution had been neglected in the past. In this paper, a combination of electron diffraction, high-resolution transmission electron microscopy, and three-dimensional electron tomography was applied to characterize the morphologies and the orientation relationship of the Si-phases in an Al-Si alloy.

    Original languageEnglish
    Pages (from-to)726-731
    Number of pages6
    JournalScience and Technology of Advanced Materials
    Volume7
    Issue number7
    DOIs
    Publication statusPublished - Oct 2006

    All Science Journal Classification (ASJC) codes

    • Materials Science(all)

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