TY - JOUR
T1 - Application of three-dimensional electron tomography using bright-field imaging-Two types of Si-phases in Al-Si alloy
AU - Kaneko, Kenji
AU - Nagayama, Ryo
AU - Inoke, Koji
AU - Noguchi, Etsuko
AU - Horita, Zenji
N1 - Funding Information:
This work was supported by the 21st COE program “Functional Innovation of Molecular Informatics” of the Ministry of Education, Culture, Sports, Science and Technology, Japan. KK thanks Prof. S. Matsumura and Dr. S. Hata from Kyushu University for valuable discussions.
PY - 2006/10
Y1 - 2006/10
N2 - When a dilute amount of Si is added to Al, it results in the precipitation of Si-phases, either planar- and/or rod-type, depending on the ageing conditions. Observation of these phases had been carried out by TEM two dimensionally so far; nevertheless information of the thickness as well as the distribution had been neglected in the past. In this paper, a combination of electron diffraction, high-resolution transmission electron microscopy, and three-dimensional electron tomography was applied to characterize the morphologies and the orientation relationship of the Si-phases in an Al-Si alloy.
AB - When a dilute amount of Si is added to Al, it results in the precipitation of Si-phases, either planar- and/or rod-type, depending on the ageing conditions. Observation of these phases had been carried out by TEM two dimensionally so far; nevertheless information of the thickness as well as the distribution had been neglected in the past. In this paper, a combination of electron diffraction, high-resolution transmission electron microscopy, and three-dimensional electron tomography was applied to characterize the morphologies and the orientation relationship of the Si-phases in an Al-Si alloy.
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U2 - 10.1016/j.stam.2006.06.006
DO - 10.1016/j.stam.2006.06.006
M3 - Article
AN - SCOPUS:37849186102
SN - 1468-6996
VL - 7
SP - 726
EP - 731
JO - Science and Technology of Advanced Materials
JF - Science and Technology of Advanced Materials
IS - 7
ER -