Assessing Experimental Parameter Space for Achieving Quantitative Electron Tomography for Nanometer-Scale Plastic Deformation

Ya Peng Yu, Hiromitsu Furukawa, Noritaka Horii, Mitsuhiro Murayama

Research output: Contribution to journalArticle

Abstract

Integrating in situ deformation and electron tomography (ET) techniques allows us to visualize the materials’ response to an applied stress with nanometer spatial resolution. The capability of structural, chemical, and morphological characterization in three-dimension real time and at sub-microscopic levels alleviates several persistent problems of two-dimensional imaging such as the projection effect and postmortem appearance. On the other hand, implementing deformation mechanism introduces additional experimental constraints that could influence the accuracy of the reconstructed volumes in a different way. To materialize quantitative and statistically relevant microstructure interpretation by time-resolved ET, we evaluated several key parameters such as angular tilt range, tilt increment, and reconstruction algorithms to characterize their influences on the accuracy of size and morphology reproducibility.

Original languageEnglish
Pages (from-to)20-27
Number of pages8
JournalMetallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Volume51
Issue number1
DOIs
Publication statusPublished - Jan 1 2020
Externally publishedYes

Fingerprint

plastic deformation
Tomography
Plastic deformation
tomography
Electrons
electrons
spatial resolution
projection
Imaging techniques
microstructure
Microstructure

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Mechanics of Materials
  • Metals and Alloys

Cite this

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