Atogram and nanometer trace element detection from solid surface by soft laser ablation atomic fluorescence spectroscopy

Daisuke Nakamura, Yuji Oki, Takayuki Takao, Mitsuo Maeda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ultimate high sensitivity of trace element detection was proposed and demonstrated by solid surface analysis with laser ablation spectroscopy. Numerical calculation predicts LOD of atogram and 290ag was obtained experimentally about sodium in PMMA.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2005
PublisherOptical Society of America
ISBN (Print)1557527709, 9781557527707
Publication statusPublished - Jan 1 2005
EventConference on Lasers and Electro-Optics, CLEO 2005 - Baltimore, MD, United States
Duration: May 22 2005May 22 2005

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics, CLEO 2005
CountryUnited States
CityBaltimore, MD
Period5/22/055/22/05

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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