Atogram and nanometer trace element detection from solid surface by soft laser ablation atomic fluorescence spectroscopy

Daisuke Nakamura, Yuji Oki, Takayuki Takao, Mitsuo Maeda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ultimate high sensitivity of trace element detection was proposed and demonstrated by solid surface analysis with laser ablation spectroscopy. Numerical calculation predicts LOD of atogram and 290ag was obtained experimentally about sodium in PMMA.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2006
PublisherOptical Society of America
ISBN (Print)1557528136, 9781557528131
Publication statusPublished - Jan 1 2006
EventConference on Lasers and Electro-Optics, CLEO 2006 - Long Beach, CA, United States
Duration: May 21 2006May 21 2006

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics, CLEO 2006
Country/TerritoryUnited States
CityLong Beach, CA
Period5/21/065/21/06

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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