Atogram and nanometer trace element detection from solid surface by soft laser ablation atomic fluorescence spectroscopy

Daisuke Nakamura, Yuji Oki, Takayuki Takao, Mitsuo Maeda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ultimate high sensitivity of trace element detection was proposed and demonstrated by solid surface analysis with laser ablation spectroscopy. Numerical calculation predicts LOD of atogram and 290ag was obtained experimentally about sodium in PMMA.

Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2005
PublisherOptical Society of America
ISBN (Print)1557527709, 9781557527707
Publication statusPublished - Jan 1 2005
EventQuantum Electronics and Laser Science Conference, QELS 2005 - Baltimore, MD, United States
Duration: May 22 2005May 22 2005

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2005
CountryUnited States
CityBaltimore, MD
Period5/22/055/22/05

Fingerprint

Atomic spectroscopy
Surface analysis
Fluorescence spectroscopy
Laser ablation
Trace elements
trace elements
solid surfaces
laser ablation
Sodium
sodium
Spectroscopy
fluorescence
sensitivity
spectroscopy

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Nakamura, D., Oki, Y., Takao, T., & Maeda, M. (2005). Atogram and nanometer trace element detection from solid surface by soft laser ablation atomic fluorescence spectroscopy. In Quantum Electronics and Laser Science Conference, QELS 2005 (Optics InfoBase Conference Papers). Optical Society of America.

Atogram and nanometer trace element detection from solid surface by soft laser ablation atomic fluorescence spectroscopy. / Nakamura, Daisuke; Oki, Yuji; Takao, Takayuki; Maeda, Mitsuo.

Quantum Electronics and Laser Science Conference, QELS 2005. Optical Society of America, 2005. (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nakamura, D, Oki, Y, Takao, T & Maeda, M 2005, Atogram and nanometer trace element detection from solid surface by soft laser ablation atomic fluorescence spectroscopy. in Quantum Electronics and Laser Science Conference, QELS 2005. Optics InfoBase Conference Papers, Optical Society of America, Quantum Electronics and Laser Science Conference, QELS 2005, Baltimore, MD, United States, 5/22/05.
Nakamura D, Oki Y, Takao T, Maeda M. Atogram and nanometer trace element detection from solid surface by soft laser ablation atomic fluorescence spectroscopy. In Quantum Electronics and Laser Science Conference, QELS 2005. Optical Society of America. 2005. (Optics InfoBase Conference Papers).
Nakamura, Daisuke ; Oki, Yuji ; Takao, Takayuki ; Maeda, Mitsuo. / Atogram and nanometer trace element detection from solid surface by soft laser ablation atomic fluorescence spectroscopy. Quantum Electronics and Laser Science Conference, QELS 2005. Optical Society of America, 2005. (Optics InfoBase Conference Papers).
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