Atom locations in a Ni doped η-(Cu,Ni)6Sn5 intermetallic compound

Wenhui Yang; Tomokazu Yamamoto; Kohei Aso; Flora Somidin; Kazuhiro Nogita; Syo Matsumura

doi:10.1016/j.scriptamat.2018.08.020

Atom locations in a Ni doped η-(Cu,Ni)₆Sn₅ intermetallic compound

Wenhui Yang, Tomokazu Yamamoto, Kohei Aso, Flora Somidin, Kazuhiro Nogita, Syo Matsumura

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

The present study has succeeded in direct determination of the location of dopant Ni atoms in η-(Cu,Ni)₆Sn₅ by aberration-corrected scanning transmission electron microscopy (STEM) including atomic-resolution imaging as well as elemental mapping by X-ray energy-dispersive spectroscopy (XEDS). The three sublattices of Sn, Cu1 and Cu2 were distinguished in atomic-resolution images observed along the [21¯1¯0] direction. Atomic-resolution XEDS maps have verified for the first time that the dopant Ni atoms located at the Cu2 sites in η-(Cu,Ni)₆Sn₅, taking advantage of the Poisson non-local principal component analysis (NLPCA) processing and the lattice-averaging procedure.

Original language	English
Pages (from-to)	1-5
Number of pages	5
Journal	Scripta Materialia
Volume	158
DOIs	https://doi.org/10.1016/j.scriptamat.2018.08.020
Publication status	Published - Jan 1 2019

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys

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10.1016/j.scriptamat.2018.08.020

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title = "Atom locations in a Ni doped η-(Cu,Ni)6Sn5 intermetallic compound",

abstract = "The present study has succeeded in direct determination of the location of dopant Ni atoms in η-(Cu,Ni)6Sn5 by aberration-corrected scanning transmission electron microscopy (STEM) including atomic-resolution imaging as well as elemental mapping by X-ray energy-dispersive spectroscopy (XEDS). The three sublattices of Sn, Cu1 and Cu2 were distinguished in atomic-resolution images observed along the [21¯1¯0] direction. Atomic-resolution XEDS maps have verified for the first time that the dopant Ni atoms located at the Cu2 sites in η-(Cu,Ni)6Sn5, taking advantage of the Poisson non-local principal component analysis (NLPCA) processing and the lattice-averaging procedure.",

author = "Wenhui Yang and Tomokazu Yamamoto and Kohei Aso and Flora Somidin and Kazuhiro Nogita and Syo Matsumura",

note = "Funding Information: This work was supported by the Progress 100 program at Kyushu University (KU) and a “UQ-KU project” at the University of Queensland (UQ), which assists research collaborations between UQ and KU. W.H. Yang is financially supported by a China Scholarship Council (CSC) Scholarship. Publisher Copyright: {\textcopyright} 2018 Elsevier Ltd",

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doi = "10.1016/j.scriptamat.2018.08.020",

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T1 - Atom locations in a Ni doped η-(Cu,Ni)6Sn5 intermetallic compound

AU - Yang, Wenhui

AU - Yamamoto, Tomokazu

AU - Aso, Kohei

AU - Somidin, Flora

AU - Nogita, Kazuhiro

AU - Matsumura, Syo

N1 - Funding Information: This work was supported by the Progress 100 program at Kyushu University (KU) and a “UQ-KU project” at the University of Queensland (UQ), which assists research collaborations between UQ and KU. W.H. Yang is financially supported by a China Scholarship Council (CSC) Scholarship. Publisher Copyright: © 2018 Elsevier Ltd

PY - 2019/1/1

Y1 - 2019/1/1

N2 - The present study has succeeded in direct determination of the location of dopant Ni atoms in η-(Cu,Ni)6Sn5 by aberration-corrected scanning transmission electron microscopy (STEM) including atomic-resolution imaging as well as elemental mapping by X-ray energy-dispersive spectroscopy (XEDS). The three sublattices of Sn, Cu1 and Cu2 were distinguished in atomic-resolution images observed along the [21¯1¯0] direction. Atomic-resolution XEDS maps have verified for the first time that the dopant Ni atoms located at the Cu2 sites in η-(Cu,Ni)6Sn5, taking advantage of the Poisson non-local principal component analysis (NLPCA) processing and the lattice-averaging procedure.

AB - The present study has succeeded in direct determination of the location of dopant Ni atoms in η-(Cu,Ni)6Sn5 by aberration-corrected scanning transmission electron microscopy (STEM) including atomic-resolution imaging as well as elemental mapping by X-ray energy-dispersive spectroscopy (XEDS). The three sublattices of Sn, Cu1 and Cu2 were distinguished in atomic-resolution images observed along the [21¯1¯0] direction. Atomic-resolution XEDS maps have verified for the first time that the dopant Ni atoms located at the Cu2 sites in η-(Cu,Ni)6Sn5, taking advantage of the Poisson non-local principal component analysis (NLPCA) processing and the lattice-averaging procedure.

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JO - Scripta Materialia

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Atom locations in a Ni doped η-(Cu,Ni)₆Sn₅ intermetallic compound

Abstract

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