Atom locations in a Ni doped η-(Cu,Ni)6Sn5 intermetallic compound

Wenhui Yang, Tomokazu Yamamoto, Kohei Aso, Flora Somidin, Kazuhiro Nogita, Syo Matsumura

Research output: Contribution to journalArticle

Abstract

The present study has succeeded in direct determination of the location of dopant Ni atoms in η-(Cu,Ni)6Sn5 by aberration-corrected scanning transmission electron microscopy (STEM) including atomic-resolution imaging as well as elemental mapping by X-ray energy-dispersive spectroscopy (XEDS). The three sublattices of Sn, Cu1 and Cu2 were distinguished in atomic-resolution images observed along the [21¯1¯0] direction. Atomic-resolution XEDS maps have verified for the first time that the dopant Ni atoms located at the Cu2 sites in η-(Cu,Ni)6Sn5, taking advantage of the Poisson non-local principal component analysis (NLPCA) processing and the lattice-averaging procedure.

LanguageEnglish
Pages1-5
Number of pages5
JournalScripta Materialia
Volume158
DOIs
Publication statusPublished - Jan 1 2019

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Nickel compounds
nickel compounds
High resolution transmission electron microscopy
Intermetallics
intermetallics
Energy dispersive spectroscopy
Doping (additives)
Transmission electron microscopy
Atoms
transmission electron microscopy
Scanning electron microscopy
scanning electron microscopy
image resolution
Image resolution
principal components analysis
Aberrations
Principal component analysis
spectroscopy
sublattices
atoms

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

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Atom locations in a Ni doped η-(Cu,Ni)6Sn5 intermetallic compound. / Yang, Wenhui; Yamamoto, Tomokazu; Aso, Kohei; Somidin, Flora; Nogita, Kazuhiro; Matsumura, Syo.

In: Scripta Materialia, Vol. 158, 01.01.2019, p. 1-5.

Research output: Contribution to journalArticle

Yang, Wenhui ; Yamamoto, Tomokazu ; Aso, Kohei ; Somidin, Flora ; Nogita, Kazuhiro ; Matsumura, Syo. / Atom locations in a Ni doped η-(Cu,Ni)6Sn5 intermetallic compound. In: Scripta Materialia. 2019 ; Vol. 158. pp. 1-5.
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