Atomic structure analysis of amorphous tb-fe1-xcox film systems

Yoshimine Kato, Shinji Takayama, Eiichiro Matsubara, Yoshio Waseda

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The atomic structure of sputtered amorphous Tb-Fe1-xCox thin film systems was studied by X-ray scattering. The composition fraction x was varied systematically, and the basic atomic structures of Tb-Fe1-xCox films were similar as a whole. The interatomic distances in Tb-Fe1-xCox films annealed at 200°C, overall, tend to decrease when the Co content is increased. These distances seem to change discontinuously at a composition of around x=0.5. The coordination numbers of the corresponding atoms did not show much correlation with Co concentration except in the case of transi­tion metal atoms around a transition metal atom. In this case, the coordination number increases after annealing, but this increment tends to decrease as the Co concentration increases in Tb-Fe1-xCox films.

Original languageEnglish
Pages (from-to)764-767
Number of pages4
JournalJapanese Journal of Applied Physics
Volume30
Issue number4
DOIs
Publication statusPublished - Apr 1991
Externally publishedYes

Fingerprint

atomic structure
coordination number
Atoms
Transition metals
transition metals
atoms
X ray scattering
Chemical analysis
Annealing
Thin films
annealing
thin films
scattering
x rays

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Atomic structure analysis of amorphous tb-fe1-xcox film systems. / Kato, Yoshimine; Takayama, Shinji; Matsubara, Eiichiro; Waseda, Yoshio.

In: Japanese Journal of Applied Physics, Vol. 30, No. 4, 04.1991, p. 764-767.

Research output: Contribution to journalArticle

Kato, Yoshimine ; Takayama, Shinji ; Matsubara, Eiichiro ; Waseda, Yoshio. / Atomic structure analysis of amorphous tb-fe1-xcox film systems. In: Japanese Journal of Applied Physics. 1991 ; Vol. 30, No. 4. pp. 764-767.
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