Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2

Hajime Hojo; Eita Tochigi; Teruyasu Mizoguchi; Hiromichi Ohta; Naoya Shibata; Bin Feng; Yuichi Ikuhara

doi:10.1063/1.3575566

Atomic structure and strain field of threading dislocations in CeO ₂ thin films on yttria-stabilized ZrO₂

Hajime Hojo, Eita Tochigi, Teruyasu Mizoguchi, Hiromichi Ohta, Naoya Shibata, Bin Feng, Yuichi Ikuhara

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

Threading dislocations in CeO₂ thin films grown on yttria-stabilized ZrO₂ substrates were investigated by transmission electron microscopy (TEM), high-resolution TEM, and scanning TEM. It is revealed that there are two kinds of threading dislocations with the Burgers vector of b=1/2 〈 110 〉: one is pure edge-type and the other is mixed-type. Comparing the strain field of the mixed-type dislocations with that of the Peierls-Nabarro and the Foreman dislocation models, we find that the Foreman model better describes it in CeO₂.

Original language	English
Article number	153104
Journal	Applied Physics Letters
Volume	98
Issue number	15
DOIs	https://doi.org/10.1063/1.3575566
Publication status	Published - Apr 11 2011
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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title = "Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2",

abstract = "Threading dislocations in CeO2 thin films grown on yttria-stabilized ZrO2 substrates were investigated by transmission electron microscopy (TEM), high-resolution TEM, and scanning TEM. It is revealed that there are two kinds of threading dislocations with the Burgers vector of b=1/2 〈 110 〉: one is pure edge-type and the other is mixed-type. Comparing the strain field of the mixed-type dislocations with that of the Peierls-Nabarro and the Foreman dislocation models, we find that the Foreman model better describes it in CeO2.",

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T1 - Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2

AU - Hojo, Hajime

AU - Tochigi, Eita

AU - Mizoguchi, Teruyasu

AU - Ohta, Hiromichi

AU - Shibata, Naoya

AU - Feng, Bin

AU - Ikuhara, Yuichi

PY - 2011/4/11

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N2 - Threading dislocations in CeO2 thin films grown on yttria-stabilized ZrO2 substrates were investigated by transmission electron microscopy (TEM), high-resolution TEM, and scanning TEM. It is revealed that there are two kinds of threading dislocations with the Burgers vector of b=1/2 〈 110 〉: one is pure edge-type and the other is mixed-type. Comparing the strain field of the mixed-type dislocations with that of the Peierls-Nabarro and the Foreman dislocation models, we find that the Foreman model better describes it in CeO2.

AB - Threading dislocations in CeO2 thin films grown on yttria-stabilized ZrO2 substrates were investigated by transmission electron microscopy (TEM), high-resolution TEM, and scanning TEM. It is revealed that there are two kinds of threading dislocations with the Burgers vector of b=1/2 〈 110 〉: one is pure edge-type and the other is mixed-type. Comparing the strain field of the mixed-type dislocations with that of the Peierls-Nabarro and the Foreman dislocation models, we find that the Foreman model better describes it in CeO2.

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