Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2

Hajime Hojo, Eita Tochigi, Teruyasu Mizoguchi, Hiromichi Ohta, Naoya Shibata, Bin Feng, Yuichi Ikuhara

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)

Abstract

Threading dislocations in CeO2 thin films grown on yttria-stabilized ZrO2 substrates were investigated by transmission electron microscopy (TEM), high-resolution TEM, and scanning TEM. It is revealed that there are two kinds of threading dislocations with the Burgers vector of b=1/2 〈 110 〉: one is pure edge-type and the other is mixed-type. Comparing the strain field of the mixed-type dislocations with that of the Peierls-Nabarro and the Foreman dislocation models, we find that the Foreman model better describes it in CeO2.

Original languageEnglish
Article number153104
JournalApplied Physics Letters
Volume98
Issue number15
DOIs
Publication statusPublished - Apr 11 2011
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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