Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2

Hajime Hojo; Eita Tochigi; Teruyasu Mizoguchi; Hiromichi Ohta; Naoya Shibata; Bin Feng; Yuichi Ikuhara

doi:10.1063/1.3575566

Atomic structure and strain field of threading dislocations in CeO ₂ thin films on yttria-stabilized ZrO₂

Hajime Hojo, Eita Tochigi, Teruyasu Mizoguchi, Hiromichi Ohta, Naoya Shibata, Bin Feng, Yuichi Ikuhara

Functional Materials Science

Research output: Contribution to journal › Article

18 Citations (Scopus)

Abstract

Threading dislocations in CeO₂ thin films grown on yttria-stabilized ZrO₂ substrates were investigated by transmission electron microscopy (TEM), high-resolution TEM, and scanning TEM. It is revealed that there are two kinds of threading dislocations with the Burgers vector of b=1/2 〈 110 〉: one is pure edge-type and the other is mixed-type. Comparing the strain field of the mixed-type dislocations with that of the Peierls-Nabarro and the Foreman dislocation models, we find that the Foreman model better describes it in CeO₂.

Original language	English
Article number	153104
Journal	Applied Physics Letters
Volume	98
Issue number	15
DOIs	https://doi.org/10.1063/1.3575566
Publication status	Published - Apr 11 2011

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atomic structure

thin films

transmission electron microscopy

scanning electron microscopy

high resolution

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Cite this

Hojo, H., Tochigi, E., Mizoguchi, T., Ohta, H., Shibata, N., Feng, B., & Ikuhara, Y. (2011). Atomic structure and strain field of threading dislocations in CeO ₂ thin films on yttria-stabilized ZrO₂. Applied Physics Letters, 98(15), [153104]. https://doi.org/10.1063/1.3575566

Atomic structure and strain field of threading dislocations in CeO ₂ thin films on yttria-stabilized ZrO₂. / Hojo, Hajime; Tochigi, Eita; Mizoguchi, Teruyasu; Ohta, Hiromichi; Shibata, Naoya; Feng, Bin; Ikuhara, Yuichi.

In: Applied Physics Letters, Vol. 98, No. 15, 153104, 11.04.2011.

Research output: Contribution to journal › Article

Hojo, H, Tochigi, E, Mizoguchi, T, Ohta, H, Shibata, N, Feng, B & Ikuhara, Y 2011, 'Atomic structure and strain field of threading dislocations in CeO ₂ thin films on yttria-stabilized ZrO₂', Applied Physics Letters, vol. 98, no. 15, 153104. https://doi.org/10.1063/1.3575566

Hojo H, Tochigi E, Mizoguchi T, Ohta H, Shibata N, Feng B et al. Atomic structure and strain field of threading dislocations in CeO ₂ thin films on yttria-stabilized ZrO₂. Applied Physics Letters. 2011 Apr 11;98(15). 153104. https://doi.org/10.1063/1.3575566

Hojo, Hajime ; Tochigi, Eita ; Mizoguchi, Teruyasu ; Ohta, Hiromichi ; Shibata, Naoya ; Feng, Bin ; Ikuhara, Yuichi. / Atomic structure and strain field of threading dislocations in CeO ₂ thin films on yttria-stabilized ZrO₂. In: Applied Physics Letters. 2011 ; Vol. 98, No. 15.

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