Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2

Hajime Hojo, Eita Tochigi, Teruyasu Mizoguchi, Hiromichi Ohta, Naoya Shibata, Bin Feng, Yuichi Ikuhara

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

Threading dislocations in CeO2 thin films grown on yttria-stabilized ZrO2 substrates were investigated by transmission electron microscopy (TEM), high-resolution TEM, and scanning TEM. It is revealed that there are two kinds of threading dislocations with the Burgers vector of b=1/2 〈 110 〉: one is pure edge-type and the other is mixed-type. Comparing the strain field of the mixed-type dislocations with that of the Peierls-Nabarro and the Foreman dislocation models, we find that the Foreman model better describes it in CeO2.

Original languageEnglish
Article number153104
JournalApplied Physics Letters
Volume98
Issue number15
DOIs
Publication statusPublished - Apr 11 2011

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atomic structure
thin films
transmission electron microscopy
scanning electron microscopy
high resolution

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2. / Hojo, Hajime; Tochigi, Eita; Mizoguchi, Teruyasu; Ohta, Hiromichi; Shibata, Naoya; Feng, Bin; Ikuhara, Yuichi.

In: Applied Physics Letters, Vol. 98, No. 15, 153104, 11.04.2011.

Research output: Contribution to journalArticle

Hojo, Hajime ; Tochigi, Eita ; Mizoguchi, Teruyasu ; Ohta, Hiromichi ; Shibata, Naoya ; Feng, Bin ; Ikuhara, Yuichi. / Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2. In: Applied Physics Letters. 2011 ; Vol. 98, No. 15.
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