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Band alignment of Ga2O3/Si heterojunction interface measured by X-ray photoelectron spectroscopy
Zhengwei Chen, Kazuo Nishihagi, Xu Wang, Katsuhiko Saito, Tooru Tanaka, Mitsuhiro Nishio, Makoto Arita, Qixin Guo
Research output: Contribution to journal › Article › peer-review
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