Band alignment of InGaZnO 4/Si interface by hard x-ray photoelectron spectroscopy

Kyeongmi Lee, Kenji Nomura, Hiroshi Yanagi, Toshio Kamiya, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Hideo Hosono

Research output: Contribution to journalArticlepeer-review

40 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Band alignment of InGaZnO <sub>4</sub>/Si interface by hard x-ray photoelectron spectroscopy'. Together they form a unique fingerprint.

Physics & Astronomy