Beam emission spectroscopy with radially and poloidally elongated optical sightlines

M. Ono, K. Ida, T. Kobayashi, M. Yoshinuma, Y. Nakamura, M. Kisaki, H. Nakano, C. Moon

Research output: Contribution to journalArticle

Abstract

Beam emission spectroscopy is widely used as local density fluctuation measurement of fusion plasmas. We have installed a beam emission spectroscopy system in the large helical device (LHD) with radially and poloidally elongated optical configuration to enhance both signal-to-noise ratio and wavenumber sensitivity in radial and poloidal directions. The calculation considering the integral effect of the line of sight showed the radially and poloidally elongated sightlines have increased sensitivity compared with the square shaped bundle design of the same sampling area.

Original languageEnglish
Article number11E559
JournalReview of Scientific Instruments
Volume87
Issue number11
DOIs
Publication statusPublished - Nov 1 2016
Externally publishedYes

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Emission spectroscopy
sensitivity
line of sight
spectroscopy
bundles
Signal to noise ratio
signal to noise ratios
Fusion reactions
fusion
sampling
Sampling
Plasmas
configurations

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Beam emission spectroscopy with radially and poloidally elongated optical sightlines. / Ono, M.; Ida, K.; Kobayashi, T.; Yoshinuma, M.; Nakamura, Y.; Kisaki, M.; Nakano, H.; Moon, C.

In: Review of Scientific Instruments, Vol. 87, No. 11, 11E559, 01.11.2016.

Research output: Contribution to journalArticle

Ono, M, Ida, K, Kobayashi, T, Yoshinuma, M, Nakamura, Y, Kisaki, M, Nakano, H & Moon, C 2016, 'Beam emission spectroscopy with radially and poloidally elongated optical sightlines', Review of Scientific Instruments, vol. 87, no. 11, 11E559. https://doi.org/10.1063/1.4963311
Ono, M. ; Ida, K. ; Kobayashi, T. ; Yoshinuma, M. ; Nakamura, Y. ; Kisaki, M. ; Nakano, H. ; Moon, C. / Beam emission spectroscopy with radially and poloidally elongated optical sightlines. In: Review of Scientific Instruments. 2016 ; Vol. 87, No. 11.
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