Behavior of deuterium retention and surface morphology for VPS-W/F82H

Yasuhisa Oya, Masashi Shimada, Tomonori Tokunaga, Hideo Watanabe, Naoaki Yoshida, Yuji Hatano, Ryuta Kasada, Takuya Nagasaka, Akihiko Kimura, Kenji Okuno

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The deuterium (D) retention for Vacuum Plasma Spray (VPS)-tungsten (W)/F82H was studied using two different implantation methods, namely D plasma exposure and D2+ implantation. The D retention for polished VPS-W/F82H after plasma exposure was found to be reduced compared to that for polycrystalline tungsten. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) observations indicated that porous structures around grain boundaries and the interface between VPS-W layers would be potential D diffusion paths, leading to low D retention. In the case of D2+ implantation, the shape of D2 TDS spectrum was almost the same as that for D plasma-exposed VPS-W/F82H; however, the D retention was quite high for unpolished VPS-W/F82H, indicating that most of D was trapped by the oxide layer, which was produced by the VPS process. The reduction of surface area due to the polishing process also reduces D retention for VPS-W/F82H. These results indicate that controlling the surface chemical states is important for the reduction of tritium retention for future fusion reactors.

Original languageEnglish
JournalJournal of Nuclear Materials
Volume442
Issue number1-3 SUPPL.1
DOIs
Publication statusPublished - Feb 14 2013

Fingerprint

Deuterium
Surface morphology
sprayers
deuterium
Vacuum
Plasmas
vacuum
implantation
Tungsten
tungsten
Tritium
fusion reactors
Fusion reactors
tritium
Polishing
polishing
Oxides
Grain boundaries
grain boundaries
Transmission electron microscopy

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Materials Science(all)
  • Nuclear Energy and Engineering

Cite this

Oya, Y., Shimada, M., Tokunaga, T., Watanabe, H., Yoshida, N., Hatano, Y., ... Okuno, K. (2013). Behavior of deuterium retention and surface morphology for VPS-W/F82H. Journal of Nuclear Materials, 442(1-3 SUPPL.1). https://doi.org/10.1016/j.jnucmat.2013.01.321

Behavior of deuterium retention and surface morphology for VPS-W/F82H. / Oya, Yasuhisa; Shimada, Masashi; Tokunaga, Tomonori; Watanabe, Hideo; Yoshida, Naoaki; Hatano, Yuji; Kasada, Ryuta; Nagasaka, Takuya; Kimura, Akihiko; Okuno, Kenji.

In: Journal of Nuclear Materials, Vol. 442, No. 1-3 SUPPL.1, 14.02.2013.

Research output: Contribution to journalArticle

Oya, Y, Shimada, M, Tokunaga, T, Watanabe, H, Yoshida, N, Hatano, Y, Kasada, R, Nagasaka, T, Kimura, A & Okuno, K 2013, 'Behavior of deuterium retention and surface morphology for VPS-W/F82H', Journal of Nuclear Materials, vol. 442, no. 1-3 SUPPL.1. https://doi.org/10.1016/j.jnucmat.2013.01.321
Oya, Yasuhisa ; Shimada, Masashi ; Tokunaga, Tomonori ; Watanabe, Hideo ; Yoshida, Naoaki ; Hatano, Yuji ; Kasada, Ryuta ; Nagasaka, Takuya ; Kimura, Akihiko ; Okuno, Kenji. / Behavior of deuterium retention and surface morphology for VPS-W/F82H. In: Journal of Nuclear Materials. 2013 ; Vol. 442, No. 1-3 SUPPL.1.
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