Bipolar Transistor Test Structures for Extracting Minority Carrier Lifetime in IGBTs

Kiyoshi Takeuchi, Munetoshi Fukui, Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Shinichi Suzuki, Yohichiroh Numasawa, Naoyuki Shigyo, Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Atsushi Ogura, Wataru Saito, Shin Ichi Nishizawa, Masanori Tsukuda, Ichiro OmuraHiromichi Ohashi, Toshiro Hiramoto

Research output: Contribution to journalArticle

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science