Bubble formation in silicon-quartz interface

K. Kakimoto, M. Eguchi, H. Ozoe

Research output: Contribution to journalArticle

Abstract

Bubble formation at an interface between silicon melt and a quartz crucible was studied by thermodynamical calculation and visualization of bubble formation using X-ray radiography. A phase diagram of silicon-oxygen (Si-O) system is also calculated from the reported thermodynamical data. Critical temperature and radius of bubble formation at the interface was discussed.

Original languageEnglish
Pages (from-to)47-49
Number of pages3
JournalScience Reports of the Rerearch Institutes Tohoku University Series A-Physics
Volume43
Issue number1
Publication statusPublished - Dec 1 1997

Fingerprint

Bubble formation
Quartz
Silicon
bubbles
quartz
silicon
X ray radiography
oxygen supply equipment
Crucibles
crucibles
radiography
Phase diagrams
critical temperature
Visualization
phase diagrams
Oxygen
radii
x rays
Temperature

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Metals and Alloys

Cite this

Bubble formation in silicon-quartz interface. / Kakimoto, K.; Eguchi, M.; Ozoe, H.

In: Science Reports of the Rerearch Institutes Tohoku University Series A-Physics, Vol. 43, No. 1, 01.12.1997, p. 47-49.

Research output: Contribution to journalArticle

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