CAICISS and STM study of c (8 × 4) and (5 × 1) tin phases on Si(1 0 0)

Anton Visikovskiy, Hideyuki Shibata, Masamichi Yoshimura, Kazuyuki Ueda

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Abstract

Tin (Sn) adsorption on Si(1 0 0) surface has been studied by scanning tunneling microscopy (STM) and co-axial impact collision ion scattering spectroscopy (CAICISS). The c (8 × 4) and (5 × 1) phases were analyzed to reveal their atomic structure. It has been confirmed that the c (8 × 4) structure consists of buckled Sn dimers. The (5 × 1) structure has been found to be partially irregular along (5 × 1) rows and to consist of double Sn layer. The Sn atoms in the first layer are undimerised while those in second layer form asymmetric dimers.

Original languageEnglish
Pages (from-to)1770-1774
Number of pages5
JournalSurface Science
Volume602
Issue number10
DOIs
Publication statusPublished - May 15 2008
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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