CAICISS and STM study of c (8 × 4) and (5 × 1) tin phases on Si(1 0 0)

Anton Visikovskiy, Hideyuki Shibata, Masamichi Yoshimura, Kazuyuki Ueda

Research output: Contribution to journalArticle

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Abstract

Tin (Sn) adsorption on Si(1 0 0) surface has been studied by scanning tunneling microscopy (STM) and co-axial impact collision ion scattering spectroscopy (CAICISS). The c (8 × 4) and (5 × 1) phases were analyzed to reveal their atomic structure. It has been confirmed that the c (8 × 4) structure consists of buckled Sn dimers. The (5 × 1) structure has been found to be partially irregular along (5 × 1) rows and to consist of double Sn layer. The Sn atoms in the first layer are undimerised while those in second layer form asymmetric dimers.

Original languageEnglish
Pages (from-to)1770-1774
Number of pages5
JournalSurface Science
Volume602
Issue number10
DOIs
Publication statusPublished - May 15 2008
Externally publishedYes

Fingerprint

Tin
ion scattering
Scanning tunneling microscopy
Dimers
scanning tunneling microscopy
tin
Spectroscopy
Scattering
Ions
collisions
dimers
spectroscopy
Adsorption
atomic structure
Atoms
adsorption
atoms

All Science Journal Classification (ASJC) codes

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

CAICISS and STM study of c (8 × 4) and (5 × 1) tin phases on Si(1 0 0). / Visikovskiy, Anton; Shibata, Hideyuki; Yoshimura, Masamichi; Ueda, Kazuyuki.

In: Surface Science, Vol. 602, No. 10, 15.05.2008, p. 1770-1774.

Research output: Contribution to journalArticle

Visikovskiy, Anton ; Shibata, Hideyuki ; Yoshimura, Masamichi ; Ueda, Kazuyuki. / CAICISS and STM study of c (8 × 4) and (5 × 1) tin phases on Si(1 0 0). In: Surface Science. 2008 ; Vol. 602, No. 10. pp. 1770-1774.
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