Calculation of light-hadron induced single-event upset cross sections for semicond uctor memory devices

Taketo Ikeuchi, Yukinobu Watanabe, Weili Sun, Hideki Nakashima

Research output: Contribution to journalArticle

Abstract

Light-hadron induced single-event upset (SEU) cross sections for semiconductor memory devices are calculated by the Burst Generation Rate (BGR) method using the LA150 data and JQMD calculation in the incident energy range between 20 MeV and 3 GeV. The calculated results are compared with experimental SEU cross sections, and the validity of the calculation method and the nuclear data used is examined. The range of the incident energy and the atomic and mass numbers of the reaction products that provides the important effects on SEU are investigated.

Original languageEnglish
Pages (from-to)1380-1383
Number of pages4
Journaljournal of nuclear science and technology
Volume39
DOIs
Publication statusPublished - Aug 2002

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering

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