CAT: A critical-area-targeted test set modification scheme for reducing launch switching activity in at-speed scan testing

K. Enokimoto, X. Wen, Y. Yamato, K. Miyase, H. Sone, S. Kajihara, M. Aso, H. Furukawa, H. Furukawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

Reducing excessive launch switching activity (LSA) is now mandatory in at-Speed scan testing for avoiding test-Induced yield loss, and test set modification is preferable for this purpose. However, previous low-LSA test set modification methods may be ineffective since they are not targeted at reducing launch switching activity in the areas around long sensitized paths, which are spatially and temporally critical for test-Induced yield loss. This paper proposes a novel CAT (Critical-Area-Targeted) low-LSA test modification scheme, which uses long sensitized paths to guide launch-Safety checking, test relaxation, and X-Filling. As a result, launch switching activity is reduced in a pinpoint manner, which is more effective for avoiding test-Induced yield loss. Experimental results on industrial circuits demonstrate the advantage of the CAT scheme for reducing launch switching activity in at-Speed scan testing.

Original languageEnglish
Title of host publicationProceedings of the 18th Asian Test Symposium, ATS 2009
Pages99-104
Number of pages6
DOIs
Publication statusPublished - 2009
Event18th Asian Test Symposium, ATS 2009 - Taichung, Taiwan, Province of China
Duration: Nov 23 2009Nov 26 2009

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Other

Other18th Asian Test Symposium, ATS 2009
CountryTaiwan, Province of China
CityTaichung
Period11/23/0911/26/09

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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