CAT: A critical-area-targeted test set modification scheme for reducing launch switching activity in at-speed scan testing

K. Enokimoto, X. Wen, Y. Yamato, K. Miyase, H. Sone, S. Kajihara, M. Aso, H. Furukawa, H. Furukawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

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Engineering & Materials Science