Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L12-type Ni3(Al, Ta)

Z. Horita, M. R. McCartney, H. Kuninaka

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7 Citations (Scopus)

Abstract

Site occupancy has been determined using the channelling-enhanced microanalysis for a Ni3(Al, Ta) intermetallic compound with the L12-type crystal structure. It is shown that there is a large scattering of data points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channelling electron distribution on the A1 and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indistinguishable difference between channelling electron intensities on the A1 and Ni columns.

Original languageEnglish
Pages (from-to)153-167
Number of pages15
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume75
Issue number1
DOIs
Publication statusPublished - Jan 1997

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)
  • Metals and Alloys

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