Characterization of crack-tip dislocations and their effects on materials fracture

Kenji Higashida, Masaki Tanaka, Sunao Sadamatsu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Three-dimensional structure of crack tip dislocations were investigated by combining scanning transmission electron microscopy (STEM) and electron tomography (ET) in silicon single crystals. P-type (001) silicon single crystals were employed. <110> cracks were introduced from an indent on the (001) surface. The specimen was heated at 873K in order to introduce dislocations at the crack tips. The specimen was thinned to include the crack tip in the foil by an iron milling machine. STEM-ET observation revealed the three-dimensional structure of crack tip dislocations. Their Burgers vectors were determined by using an invisibility criterion. The local stress intensity factor was calculated using the dislocation characters obtained in the observation in this study, indicating that the dislocations observed were mode II shielding type dislocations.

Original languageEnglish
Title of host publicationPRICM7
Pages2307-2311
Number of pages5
Volume654-656
DOIs
Publication statusPublished - 2010
Event7th Pacific Rim International Conference on Advanced Materials and Processing, PRICM-7 - Cairns, QLD, Australia
Duration: Aug 2 2010Aug 6 2010

Publication series

NameMaterials Science Forum
Volume654-656
ISSN (Print)02555476

Other

Other7th Pacific Rim International Conference on Advanced Materials and Processing, PRICM-7
CountryAustralia
CityCairns, QLD
Period8/2/108/6/10

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Higashida, K., Tanaka, M., & Sadamatsu, S. (2010). Characterization of crack-tip dislocations and their effects on materials fracture. In PRICM7 (Vol. 654-656, pp. 2307-2311). (Materials Science Forum; Vol. 654-656). https://doi.org/10.4028/www.scientific.net/MSF.654-656.2307