Characterization of crystalline materials by electron tomography

Research output: Contribution to journalArticle

Abstract

Combination of transmission electron microscopy and computed tomography (TEM-CT) is a powerful technique to characterize three-dimensional nature of materials. In this paper, its principle and application are described in detail. In addition, as an example, TEM and TEM-CT was applied on TiN-Ag nanocomposite synthesized by dc arc-plasma method. Microstructures of TiN-Ag nanocomposite were carefully characterized by TEM, and nano-morphologies by TEM-CT. It was found that the surface of nanocrystalline TiN matrix was covered by finely dispersed Ag nanoparticles, and it was found that they were physically attached but not chemically bonded. From these experimental results, formation mechanisms are also predicted.

Original languageEnglish
Pages (from-to)253-255
Number of pages3
JournalJournal of the Vacuum Society of Japan
Volume54
Issue number4
DOIs
Publication statusPublished - Aug 26 2011

Fingerprint

Tomography
tomography
Crystalline materials
Transmission electron microscopy
transmission electron microscopy
Electrons
electrons
Nanocomposites
nanocomposites
plasma jets
Nanoparticles
Plasmas
nanoparticles
microstructure
Microstructure
matrices

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Instrumentation
  • Surfaces and Interfaces
  • Spectroscopy

Cite this

Characterization of crystalline materials by electron tomography. / Kaneko, Kenji.

In: Journal of the Vacuum Society of Japan, Vol. 54, No. 4, 26.08.2011, p. 253-255.

Research output: Contribution to journalArticle

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