Characterization of grain boundaries of Al-doped sintered β-SiC by both HRTEM and STEM

K. Kaneko, T. Saitoh, S. Tsurekawa

Research output: Contribution to journalArticle

Abstract

Both high-resolution transmission electron microscope (HRTEM) and scanning transmission electron microscope (STEM) were carried out to observe the structure and chemistry of grain boundaries of Al-doped sintered β-SiC. Two specimens, an as-sintered and an compressed Al-doped sintered β-SiC specimens, were provided. Although, it was shown by energy dispersive X-ray spectroscopy (EDS) that Al and O segregated at grain boundaries of both specimens, it was discovered by electron energy loss spectroscopy (EELS) that the chemistry of grain boundaries of both specimens were different.

Original languageEnglish
Pages (from-to)269-272
Number of pages4
JournalMaterials Science Forum
Volume294-296
Publication statusPublished - Dec 1 1999
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Characterization of grain boundaries of Al-doped sintered β-SiC by both HRTEM and STEM'. Together they form a unique fingerprint.

  • Cite this