Characterization of grain boundaries of Al-doped sintered β-SiC by both HRTEM and STEM

Kenji Kaneko, T. Saitoh, S. Tsurekawa

Research output: Contribution to journalArticle

Abstract

Both high-resolution transmission electron microscope (HRTEM) and scanning transmission electron microscope (STEM) were carried out to observe the structure and chemistry of grain boundaries of Al-doped sintered β-SiC. Two specimens, an as-sintered and an compressed Al-doped sintered β-SiC specimens, were provided. Although, it was shown by energy dispersive X-ray spectroscopy (EDS) that Al and O segregated at grain boundaries of both specimens, it was discovered by electron energy loss spectroscopy (EELS) that the chemistry of grain boundaries of both specimens were different.

Original languageEnglish
Pages (from-to)269-272
Number of pages4
JournalMaterials Science Forum
Volume294-296
Publication statusPublished - Dec 1 1999
Externally publishedYes

Fingerprint

Grain boundaries
Electron microscopes
grain boundaries
electron microscopes
Scanning
scanning
high resolution
Electron energy loss spectroscopy
chemistry
Energy dispersive spectroscopy
spectroscopy
energy dissipation
electron energy
x rays
energy
X-Ray Emission Spectrometry

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Characterization of grain boundaries of Al-doped sintered β-SiC by both HRTEM and STEM. / Kaneko, Kenji; Saitoh, T.; Tsurekawa, S.

In: Materials Science Forum, Vol. 294-296, 01.12.1999, p. 269-272.

Research output: Contribution to journalArticle

@article{c93f039e3a1f46c2b23ef5240cf09fc0,
title = "Characterization of grain boundaries of Al-doped sintered β-SiC by both HRTEM and STEM",
abstract = "Both high-resolution transmission electron microscope (HRTEM) and scanning transmission electron microscope (STEM) were carried out to observe the structure and chemistry of grain boundaries of Al-doped sintered β-SiC. Two specimens, an as-sintered and an compressed Al-doped sintered β-SiC specimens, were provided. Although, it was shown by energy dispersive X-ray spectroscopy (EDS) that Al and O segregated at grain boundaries of both specimens, it was discovered by electron energy loss spectroscopy (EELS) that the chemistry of grain boundaries of both specimens were different.",
author = "Kenji Kaneko and T. Saitoh and S. Tsurekawa",
year = "1999",
month = "12",
day = "1",
language = "English",
volume = "294-296",
pages = "269--272",
journal = "Materials Science Forum",
issn = "0255-5476",
publisher = "Trans Tech Publications",

}

TY - JOUR

T1 - Characterization of grain boundaries of Al-doped sintered β-SiC by both HRTEM and STEM

AU - Kaneko, Kenji

AU - Saitoh, T.

AU - Tsurekawa, S.

PY - 1999/12/1

Y1 - 1999/12/1

N2 - Both high-resolution transmission electron microscope (HRTEM) and scanning transmission electron microscope (STEM) were carried out to observe the structure and chemistry of grain boundaries of Al-doped sintered β-SiC. Two specimens, an as-sintered and an compressed Al-doped sintered β-SiC specimens, were provided. Although, it was shown by energy dispersive X-ray spectroscopy (EDS) that Al and O segregated at grain boundaries of both specimens, it was discovered by electron energy loss spectroscopy (EELS) that the chemistry of grain boundaries of both specimens were different.

AB - Both high-resolution transmission electron microscope (HRTEM) and scanning transmission electron microscope (STEM) were carried out to observe the structure and chemistry of grain boundaries of Al-doped sintered β-SiC. Two specimens, an as-sintered and an compressed Al-doped sintered β-SiC specimens, were provided. Although, it was shown by energy dispersive X-ray spectroscopy (EDS) that Al and O segregated at grain boundaries of both specimens, it was discovered by electron energy loss spectroscopy (EELS) that the chemistry of grain boundaries of both specimens were different.

UR - http://www.scopus.com/inward/record.url?scp=33750636564&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33750636564&partnerID=8YFLogxK

M3 - Article

VL - 294-296

SP - 269

EP - 272

JO - Materials Science Forum

JF - Materials Science Forum

SN - 0255-5476

ER -