Characterization of Local Critical Current Distribution in Multifilamentary Coated Conductor Based on Reel-to-Reel Scanning Hall-Probe Microscopy

Kohei Higashikawa, Dai Uetsuhara, Masayoshi Inoue, Shinji Fujita, Yasuhiro Iijima, Takanobu Kiss

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Abstract

We have carried out the characterization of local critical current distribution in a 113-m-long multifilamentary coated conductor (CC) based on reel-to-reel scanning Hall-probe microscopy. Patterning multifilamentary structure on CCs is a key technology for the reduction of ac losses due to magnetization. Recently, this advantage has also been expected for the reduction of the magnetization in a coil winding which has been recognized as a critical problem for HTS magnet applications such as accelerators, MRI, and NMR from the viewpoint of field homogeneity and temporal stability. However, it has been difficult for the conventional techniques such as four-probe method, TAPESTAR, etc., to make diagnostics for multifilamentary CCs due to the limitation of spatial resolution. On the other hand, our measurement has an advantage in taking two-dimensional field image. This enabled us to confirm that multifilamentary structure as well as the corresponding magnetization reduction was successfully achieved in a long-length CC. At the same time, by the estimation of local critical current distribution for each filament, it was also found that there were still some local defects, which affected the global performance of the multifilamentary CC, even if the probability density of such defects was only in the order of 10-5. These findings will become crucial information for the optimization of fabrication processes of multifilamentary CCs and for their nondestructive quality assurance.

Original languageEnglish
Article number7786877
JournalIEEE Transactions on Applied Superconductivity
Volume27
Issue number4
DOIs
Publication statusPublished - Jun 2017

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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