TY - JOUR
T1 - Characterization of yttrium-doped ceria with various yttrium concentrations as cathode interlayers of SOFCs
AU - Somekawa, T.
AU - Matsuzaki, Y.
AU - Tachikawa, Y.
AU - Taniguchi, S.
AU - Sasaki, K.
N1 - Publisher Copyright:
© 2016, Springer-Verlag Berlin Heidelberg.
PY - 2017/1/1
Y1 - 2017/1/1
N2 - This study focuses on enhancing the efficiency of solid oxide fuel cells (SOFCs) by modulating the thickness of the highly resistive solid solution layer of (Ce,Zr)O2 formed between the yttria-stabilized zirconia (YSZ) electrolyte and the CeO2-based interlayer on the cathode side. The effects of the concentration of dopant in CeO2 on the thickness of the solid solution were analyzed. Yttrium-doped CeO2 (YDC) interlayers were studied, with dopant concentrations in the range of 5–40 mol%. The results revealed that the thickness of the solid solution decreased with increasing dopant concentration up to 20 mol% and then saturated at higher dopant concentrations. In addition, the electrical conductivities of yttrium-doped ceria (YDC) and the solid solution of YSZ and YDC were measured. YDC with a dopant concentration of 20 mol% exhibited the highest conductivity. The conductivities of the YSZ/YDC solid solution decreased compared to those of YDC and YSZ for each dopant concentration, and the extent of the reductions was approximately the same for all dopant concentrations. These results indicate that a dopant concentration of 20 mol% is optimal to minimize the internal resistance of SOFCs when YDC is used as the interlayer material.
AB - This study focuses on enhancing the efficiency of solid oxide fuel cells (SOFCs) by modulating the thickness of the highly resistive solid solution layer of (Ce,Zr)O2 formed between the yttria-stabilized zirconia (YSZ) electrolyte and the CeO2-based interlayer on the cathode side. The effects of the concentration of dopant in CeO2 on the thickness of the solid solution were analyzed. Yttrium-doped CeO2 (YDC) interlayers were studied, with dopant concentrations in the range of 5–40 mol%. The results revealed that the thickness of the solid solution decreased with increasing dopant concentration up to 20 mol% and then saturated at higher dopant concentrations. In addition, the electrical conductivities of yttrium-doped ceria (YDC) and the solid solution of YSZ and YDC were measured. YDC with a dopant concentration of 20 mol% exhibited the highest conductivity. The conductivities of the YSZ/YDC solid solution decreased compared to those of YDC and YSZ for each dopant concentration, and the extent of the reductions was approximately the same for all dopant concentrations. These results indicate that a dopant concentration of 20 mol% is optimal to minimize the internal resistance of SOFCs when YDC is used as the interlayer material.
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U2 - 10.1007/s11581-016-1816-9
DO - 10.1007/s11581-016-1816-9
M3 - Article
AN - SCOPUS:84986245767
SN - 0947-7047
VL - 23
SP - 95
EP - 103
JO - Ionics
JF - Ionics
IS - 1
ER -