Characterizing the superconducting-to-normal transition in Mo/Au transition-edge sensor bilayers

S. J. Smith, S. R. Bandler, A. D. Brown, J. A. Chervenak, E. Figueroa-Feliciano, F. Finkbeiner, N. Iyomoto, R. L. Kelley, C. A. Kilbourne, F. S. Porter, J. E. Sadleir

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18 Citations (Scopus)

Abstract

We are developing arrays of Mo/Au bilayer transition-edge sensors (TES's) for future X-ray astronomy missions such as NASA's Constellation-X. The physical properties of the superconducting-to-normal transition in our TES bilayers, while often reproducible and characterized, are not well understood. The addition of normal metal features on top of the bilayer are found to change the shape and temperature of the transition, and they typically reduce the unexplained 'excess' noise. In order to understand and potentially optimize the properties of the transition, we have been studying the temperature, widths and current dependence of these transitions. We report on the characterization of devices both deposited on silicon substrates and suspended on thin silicon nitride membranes. This includes key device parameters such as the logarithmic resistance sensitivity with temperature α, and the logarithmic resistance sensitivity with current β, and their correlation with excess noise.

Original languageEnglish
Pages (from-to)195-200
Number of pages6
JournalJournal of Low Temperature Physics
Volume151
Issue number1-2 PART 1
DOIs
Publication statusPublished - Apr 2008
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)
  • Condensed Matter Physics

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