Abstract
The charge survival yield for a cluster anion, I2- (CO2)n (n = 0-30) during its collision onto a silicon surface covered with silicon oxide layers of ∼2 nm in thickness was measured as a function of the number of the CO2 molecules, n, and the collision energy (per I2-) in the range of 1-80 eV. A monotonic increase in the charge survival yield with n was observed. This means that the efficiency of the charge transfer from the core ion, I2-, to the surface is reduced with the increase of n. It was concluded that the CO2 molecules suppress the charge transfer by behaving as an electrostatic 'stabilizer' of the core ion and as a 'spacer' between the core ion and the surface.
| Original language | English |
|---|---|
| Pages (from-to) | 297-303 |
| Number of pages | 7 |
| Journal | International Journal of Mass Spectrometry and Ion Processes |
| Volume | 174 |
| Issue number | 1-3 |
| Publication status | Published - Dec 1 1998 |
| Externally published | Yes |
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All Science Journal Classification (ASJC) codes
- Spectroscopy
Cite this
Charge transfer from I2- (CO2)n cluster anion to silicon surface : Cluster-size dependence. / Yasumatsu, Hisato; Terasakia, Akira; Kondow, Tamotsu.
In: International Journal of Mass Spectrometry and Ion Processes, Vol. 174, No. 1-3, 01.12.1998, p. 297-303.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Charge transfer from I2- (CO2)n cluster anion to silicon surface
T2 - Cluster-size dependence
AU - Yasumatsu, Hisato
AU - Terasakia, Akira
AU - Kondow, Tamotsu
PY - 1998/12/1
Y1 - 1998/12/1
N2 - The charge survival yield for a cluster anion, I2- (CO2)n (n = 0-30) during its collision onto a silicon surface covered with silicon oxide layers of ∼2 nm in thickness was measured as a function of the number of the CO2 molecules, n, and the collision energy (per I2-) in the range of 1-80 eV. A monotonic increase in the charge survival yield with n was observed. This means that the efficiency of the charge transfer from the core ion, I2-, to the surface is reduced with the increase of n. It was concluded that the CO2 molecules suppress the charge transfer by behaving as an electrostatic 'stabilizer' of the core ion and as a 'spacer' between the core ion and the surface.
AB - The charge survival yield for a cluster anion, I2- (CO2)n (n = 0-30) during its collision onto a silicon surface covered with silicon oxide layers of ∼2 nm in thickness was measured as a function of the number of the CO2 molecules, n, and the collision energy (per I2-) in the range of 1-80 eV. A monotonic increase in the charge survival yield with n was observed. This means that the efficiency of the charge transfer from the core ion, I2-, to the surface is reduced with the increase of n. It was concluded that the CO2 molecules suppress the charge transfer by behaving as an electrostatic 'stabilizer' of the core ion and as a 'spacer' between the core ion and the surface.
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M3 - Article
AN - SCOPUS:0000304270
VL - 174
SP - 297
EP - 303
JO - International Journal of Mass Spectrometry
JF - International Journal of Mass Spectrometry
SN - 1387-3806
IS - 1-3
ER -