Clustering parameter and internal stress in iii-v ternary alloys

Koichi Kakimoto, Takashi Katoda

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

An application of laser Raman Spectroscopy to estimate the clustering parameters and internal stress accumulated in each bond in Ga0.5Al0.5As, Ga0.52ln0.48P, Ga1-xInx (0≤ x ≤ 0.53), and GaAs0.7P0.3 is proposed. The clustering parameters and stress are evaluated from the phonon intensity and the difference between the observed optical phonon frequencies and those calculated in terms of the modified REI model, respectively. The estimated values of the clustering parameter agree fairly well with those obtained from theoretical calculation of the excess free energy of mixing. The bond lengths in Ga1-xInx (0≤ x ≤ 0.53) are derived from the stress, and are compared with published data on extended X-ray absorption fine structure.

Original languageEnglish
Pages (from-to)1022-1029
Number of pages8
JournalJapanese Journal of Applied Physics
Volume24
Issue number8 R
DOIs
Publication statusPublished - Aug 1985
Externally publishedYes

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Ternary alloys
ternary alloys
residual stress
Residual stresses
Laser spectroscopy
X ray absorption
Bond length
Free energy
Raman spectroscopy
laser spectroscopy
fine structure
free energy
estimates
x rays

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Clustering parameter and internal stress in iii-v ternary alloys. / Kakimoto, Koichi; Katoda, Takashi.

In: Japanese Journal of Applied Physics, Vol. 24, No. 8 R, 08.1985, p. 1022-1029.

Research output: Contribution to journalArticle

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