TY - GEN
T1 - Coded aperture for projector and camera for robust 3D measurement
AU - Horita, Yuuki
AU - Matugano, Yuuki
AU - Morinaga, Hiroki
AU - Kawasaki, Hiroshi
AU - Ono, Satoshi
AU - Kimura, Makoto
AU - Takane, Yasuo
PY - 2012/12/1
Y1 - 2012/12/1
N2 - General active 3D measurement system using structured light is based on triangulation, which requires correspondence between projection pattern and camera observed pattern. Since both the projected pattern and the camera image should be in focus on the target, the condition makes a severe limitation on depth range of 3D measurement. In this paper, we propose a technique using coded aperture (CA) for projector and camera system to relax the limitation. In our method, Depth from Defocus (DfD) technique is used to resolve the de-focus of projected pattern. By allowing blurry pattern of projection, measurement range is extended compared to common structured light methods. Further, overlapped blur pattern can also be resolved with our technique.
AB - General active 3D measurement system using structured light is based on triangulation, which requires correspondence between projection pattern and camera observed pattern. Since both the projected pattern and the camera image should be in focus on the target, the condition makes a severe limitation on depth range of 3D measurement. In this paper, we propose a technique using coded aperture (CA) for projector and camera system to relax the limitation. In our method, Depth from Defocus (DfD) technique is used to resolve the de-focus of projected pattern. By allowing blurry pattern of projection, measurement range is extended compared to common structured light methods. Further, overlapped blur pattern can also be resolved with our technique.
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M3 - Conference contribution
AN - SCOPUS:84874564208
SN - 9784990644109
T3 - Proceedings - International Conference on Pattern Recognition
SP - 1487
EP - 1491
BT - ICPR 2012 - 21st International Conference on Pattern Recognition
T2 - 21st International Conference on Pattern Recognition, ICPR 2012
Y2 - 11 November 2012 through 15 November 2012
ER -