Combinatorial library designs for quantifying thin film adhesion via the edge delamination test

Jae Hyun Kim, Martin Y.M. Chiang, Daisuke Kawaguchi, Naomi Eidelman, Christopher M. Stafford, Chang Kwon Moon

Research output: Contribution to journalArticle

Abstract

We have demonstrated a combinatorial thin film library design for investigating the adhesion between film and substrate as measured by the edge delamination test. This library design allows rapid screening of critical parameters that control thin film reliability and bond strength in films and coatings. Specifically, our library design was aimed at quantifying the effect of film thickness and composition on the interfacial integrity between the film and underlying substrate by applying thermal stress. To create the combinatorial library, a single specimen was fabricated having a thickness gradient of an epoxy film on glass or silicon substrates. After sectioning the film into individual squares, a temperature gradient was applied orthogonal to the thickness gradient to induce debonding events where the adhesion is below a critical value. In addition, another combinatorial library was carried out using the epoxy films with concentration gradient and constant thickness, and applying a constant temperature. The combined results clearly demonstrate that our combinatorial library design and approach provide a large parameter space for accurately and reproducibly mapping the interfacial integrity and bond strength of film/substrate systems.

Original languageEnglish
Article number34003
JournalJournal of Physics D: Applied Physics
Volume44
Issue number3
DOIs
Publication statusPublished - Jan 26 2011
Externally publishedYes

Fingerprint

Delamination
adhesion
Adhesion
Thin films
thin films
Bond strength (materials)
Substrates
gradients
integrity
Debonding
Silicon
thermal stresses
Thermal stress
Thermal gradients
Film thickness
temperature gradients
Screening
film thickness
screening
coatings

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

Cite this

Combinatorial library designs for quantifying thin film adhesion via the edge delamination test. / Kim, Jae Hyun; Chiang, Martin Y.M.; Kawaguchi, Daisuke; Eidelman, Naomi; Stafford, Christopher M.; Moon, Chang Kwon.

In: Journal of Physics D: Applied Physics, Vol. 44, No. 3, 34003, 26.01.2011.

Research output: Contribution to journalArticle

Kim, Jae Hyun ; Chiang, Martin Y.M. ; Kawaguchi, Daisuke ; Eidelman, Naomi ; Stafford, Christopher M. ; Moon, Chang Kwon. / Combinatorial library designs for quantifying thin film adhesion via the edge delamination test. In: Journal of Physics D: Applied Physics. 2011 ; Vol. 44, No. 3.
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