Common Bias Readout for TES Array on Scanning Transmission Electron Microscope

R. Yamamoto, K. Sakai, K. Maehisa, K. Nagayoshi, T. Hayashi, H. Muramatsu, Y. Nakashima, K. Mitsuda, N. Y. Yamasaki, Y. Takei, M. Hidaka, S. Nagasawa, K. Maehata, T. Hara

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Abstract

A transition edge sensor (TES) microcalorimeter array as an X-ray sensor for a scanning transmission electron microscope system is being developed. The technical challenge of this system is a high count rate of ∼ 5000 counts/second/array. We adopted a 64 pixel array with a parallel readout. Common SQUID bias, and common TES bias are planned to reduce the number of wires and the resources of a room temperature circuit. The reduction rate of wires is 44 % when a 64 pixel array is read out by a common bias of 8 channels. The possible degradation of the energy resolution has been investigated by simulations and experiments. The bias fluctuation effects of a series connection are less than those of a parallel connection. Simple calculations expect that the fluctuations of the common SQUID bias and common TES bias in a series connection are 10 - 7 and 10 - 3, respectively. We constructed 8 SQUIDs which are connected to 8 TES outputs and a room temperature circuit for common bias readout and evaluated experimentally. Our simulation of crosstalk indicates that at an X-ray event rate of 500 cps/pixel, crosstalk will broaden a monochromatic line by about 0.01 %, or about 1.5 eV at 15 keV. Thus, our design goal of 10 eV energy resolution across the 0.5–15 keV band should be achievable.

Original languageEnglish
Pages (from-to)454-459
Number of pages6
JournalJournal of Low Temperature Physics
Volume184
Issue number1-2
DOIs
Publication statusPublished - Jul 1 2016

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All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Yamamoto, R., Sakai, K., Maehisa, K., Nagayoshi, K., Hayashi, T., Muramatsu, H., ... Hara, T. (2016). Common Bias Readout for TES Array on Scanning Transmission Electron Microscope. Journal of Low Temperature Physics, 184(1-2), 454-459. https://doi.org/10.1007/s10909-016-1562-4