Common Bias Readout for TES Array on Scanning Transmission Electron Microscope

Engineering

• Sensor 100%
• Simulation 50%
• Energy Engineering 50%
• Networks (Circuits) 50%
• Crosstalk 50%
• Transmissions 50%
• Room Temperature 50%
• Series Connection 50%
• Experiments 25%
• Reduction 25%
• Design 25%
• Events 25%
• Fluctuations 25%
• Simple Calculation 25%
• Sensor Output 25%
• Parallel Connection 25%
• Sensor Array 25%
• Technical Challenge 25%

Physics

• Arrays 100%
• Simulation 50%
• X Ray 50%
• Room Temperature 50%
• Circuits 50%
• Events 25%
• Variations 25%
• Degradation 25%