Comparative study of carrier concentration and reciprocal space mapping in SmBa2Cu3Oy thin films with high critical current density

Yusuke Ichino, Masashi Miura, Toshinori Ozaki, Yutaka Yoshida, Yoshiaki Takaia, Kaname Matsumoto, Masashi Mukaida, Ataru Ichinose, Shigeru Horii

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We have reported SmBa2Cu3Oy (Sm123) films prepared using a pulsed laser deposition (PLD) method. In particularly, Sm123 thin films prepared using a low temperature growth technique (LTG) could achieve a high-Jc in a magnetic field at 77 K comparable to that in a Nb-Ti wire at 4.2 K. In order to clarify a mechanism of high-Jc in LTG-Sm123 films, we compared an X-ray reciprocal space mapping (RSM) and a carrier concentration in the LTG films with those in PLD films. Although a Sm123 peak split on the RSM which corresponds to an orthorhombic structure, was observed in the PLD films with a thickness of ≥100 nm, the LTG films did not show such split. Further, from an annealing time dependence of the carrier concentration, a carrier injection into the LTG films tended to be difficult as compared to that into the PLD films. These facts imply that the LTG technique gives a high crystallinity. Therefore, we concluded that one of reasons of the high-Jc in the LTG films was an improvement of crystalline uniformity such as an orientation and a lattice constant.

Original languageEnglish
Pages (from-to)689-693
Number of pages5
JournalPhysica C: Superconductivity and its applications
Volume445-448
Issue number1-2
DOIs
Publication statusPublished - Oct 1 2006

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this