Comparison between Tomography and Langmuir Probe Data in PANTA

Yoshihiko Nagashima, Akihide Fujisawa, Kotaro Yamasaki, Shigeru Inagaki, Chanho Moon, Fumiyoshi Kin, Yuichi Kawachi, Hiroyuki Arakawa, Takuma Yamada, Tatsuya Kobayashi, Naohiro Kasuya, Yusuke Kosuga, Makoto Sasaki, Takeshi Ido

Research output: Contribution to journalArticlepeer-review

Abstract

Emission intensity ε from plasmas is a complicated function of electron temperature Te and electron density ne. To understand the dependence of ε on Te and ne, an experimental comparison between tomography data (local ε of ArII) and Langmuir probe data (Te and ne) in a linear plasma device PANTA is presented in this paper. In the comparison, the local emission intensity is modeled as εmodel / Teαn2e, and the model is validated by calculating both cross-correlation function and least squares of residuals between the fluctuations of ε and εmodel. The comparison reveals that the both methods provide α = 2.3–2.7, higher than 2 that of the exponent of ne. This result confirms that dependence of Te on ε is larger than that of ne when Te is low, as in PANTA.

Original languageEnglish
Article number093501
Journaljournal of the physical society of japan
Volume89
Issue number9
DOIs
Publication statusPublished - Sep 15 2020

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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