Time evolution of interfacial thicknesses between a cyclic polystyrene (c-hPS) / its deuterated counterpart (c-dPS) and a linear polystyrene (1-hPS) / its deuterated counterpart (1-dPS) bilayer films was investigated by dynamic secondary ion mass spectrometry (DSIMS) and neutron reflectivity (NR). The interfacial thickness of (c-hPS/c-dPS) film was significantly larger than that of (1-hPS/1-dPS) film at any given annealing time, indicating that the diffusion constant of c-PS is constantly larger than that of 1-PS. It might be explained that weaker topological constraint comes from the entanglement for the c-PS than for the 1-PS.
|Number of pages||2|
|Publication status||Published - Dec 1 2006|
|Event||55th Society of Polymer Science Japan Symposium on Macromolecules - Toyama, Japan|
Duration: Sep 20 2006 → Sep 22 2006
|Other||55th Society of Polymer Science Japan Symposium on Macromolecules|
|Period||9/20/06 → 9/22/06|
All Science Journal Classification (ASJC) codes