Comparison of structural parameters for Zn4-xCd xSb3 compounds analyzed by the Rietveld method using two crystallographic models

Takeshi Souma, Michitaka Ohtaki

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    A comparison of detailed structural parameters between the 3IS and Mayer models for the Zn4-xCdxSb3 system in the Zn-rich region has been successfully performed by the powder XRD study with the Rietveld method using 9 bulk crystals synthesized by vacuum casting method without annealing. The 3IS model gives a better fitting on the Rietveld analysis not only for the undoped Zn4Sb3 but also for the whole compositional range of the Zn-rich region of the Zn4-xCd xSb3 compounds. The purities and densities of the bulk crystals exceeded approximately 96 mass% and 95 % of XRD density, respectively.

    Original languageEnglish
    Title of host publicationProceedings - ICT'05
    Subtitle of host publication24th International Conference on Thermoelectrics
    Pages410-413
    Number of pages4
    DOIs
    Publication statusPublished - Dec 1 2005
    EventICT'05: 24th International Conference on Thermoelectrics - Clemson, SC, United States
    Duration: Jun 19 2005Jun 23 2005

    Publication series

    NameInternational Conference on Thermoelectrics, ICT, Proceedings
    Volume2005

    Other

    OtherICT'05: 24th International Conference on Thermoelectrics
    CountryUnited States
    CityClemson, SC
    Period6/19/056/23/05

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    All Science Journal Classification (ASJC) codes

    • Engineering(all)

    Cite this

    Souma, T., & Ohtaki, M. (2005). Comparison of structural parameters for Zn4-xCd xSb3 compounds analyzed by the Rietveld method using two crystallographic models. In Proceedings - ICT'05: 24th International Conference on Thermoelectrics (pp. 410-413). [1519973] (International Conference on Thermoelectrics, ICT, Proceedings; Vol. 2005). https://doi.org/10.1109/ICT.2005.1519973