Comparison of structural parameters for Zn4-xCd xSb3 compounds analyzed by the Rietveld method using two crystallographic models

Takeshi Souma; Michitaka Ohtaki

doi:10.1109/ICT.2005.1519973

Comparison of structural parameters for Zn_4-xCd _xSb₃ compounds analyzed by the Rietveld method using two crystallographic models

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A comparison of detailed structural parameters between the 3IS and Mayer models for the Zn_4-xCd_xSb₃ system in the Zn-rich region has been successfully performed by the powder XRD study with the Rietveld method using 9 bulk crystals synthesized by vacuum casting method without annealing. The 3IS model gives a better fitting on the Rietveld analysis not only for the undoped Zn₄Sb₃ but also for the whole compositional range of the Zn-rich region of the Zn_4-xCd _xSb₃ compounds. The purities and densities of the bulk crystals exceeded approximately 96 mass% and 95 % of XRD density, respectively.

Original language	English
Title of host publication	Proceedings - ICT'05
Subtitle of host publication	24th International Conference on Thermoelectrics
Pages	410-413
Number of pages	4
DOIs	https://doi.org/10.1109/ICT.2005.1519973
Publication status	Published - 2005
Event	ICT'05: 24th International Conference on Thermoelectrics - Clemson, SC, United States Duration: Jun 19 2005 → Jun 23 2005

Publication series

Name	International Conference on Thermoelectrics, ICT, Proceedings
Volume	2005

Other

Other	ICT'05: 24th International Conference on Thermoelectrics
Country/Territory	United States
City	Clemson, SC
Period	6/19/05 → 6/23/05

All Science Journal Classification (ASJC) codes

Engineering(all)

Access to Document

10.1109/ICT.2005.1519973

Cite this

Souma, T., & Ohtaki, M. (2005). Comparison of structural parameters for Zn_4-xCd _xSb₃ compounds analyzed by the Rietveld method using two crystallographic models. In Proceedings - ICT'05: 24th International Conference on Thermoelectrics (pp. 410-413). [1519973] (International Conference on Thermoelectrics, ICT, Proceedings; Vol. 2005). https://doi.org/10.1109/ICT.2005.1519973

Comparison of structural parameters for Zn_4-xCd _xSb₃ compounds analyzed by the Rietveld method using two crystallographic models. / Souma, Takeshi; Ohtaki, Michitaka.

Proceedings - ICT'05: 24th International Conference on Thermoelectrics. 2005. p. 410-413 1519973 (International Conference on Thermoelectrics, ICT, Proceedings; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Souma, T & Ohtaki, M 2005, Comparison of structural parameters for Zn_4-xCd _xSb₃ compounds analyzed by the Rietveld method using two crystallographic models. in Proceedings - ICT'05: 24th International Conference on Thermoelectrics., 1519973, International Conference on Thermoelectrics, ICT, Proceedings, vol. 2005, pp. 410-413, ICT'05: 24th International Conference on Thermoelectrics, Clemson, SC, United States, 6/19/05. https://doi.org/10.1109/ICT.2005.1519973

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