Compensation of temperature-drift errors in fundamental-mode orthogonal fluxgates

Anton Plotkin, Eugene Paperno, Alexander Samohin, Ichiro Sasada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

A new method for the temperature-compensation of fundamental-mode orthogonal fl uxgates that does not require additional hardware has been proposed and implemented. The method is based on the employme nt of one of the two fluxgate transfer characteristics and the ph ase of the corresponding output signal. The measurement accordin g to the proposed method can be done during a single, unipolar eye le of the flu xgate excitation. This doubles the me asurement update rate compared to conventional methods. The proposed method reduces temperaturedrift errors by an order of magnitude. The fluxgate prototype has demonstrated a 20-fold (down to 100 ppm/°C) reduction of the temperature-drift errors.

Original languageEnglish
Title of host publicationIMTC'06 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
Pages1201-1204
Number of pages4
DOIs
Publication statusPublished - 2006
EventIMTC'06 - IEEE Instrumentation and Measurement Technology Conference - Sorrento, Italy
Duration: Apr 24 2006Apr 27 2006

Other

OtherIMTC'06 - IEEE Instrumentation and Measurement Technology Conference
CountryItaly
CitySorrento
Period4/24/064/27/06

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Plotkin, A., Paperno, E., Samohin, A., & Sasada, I. (2006). Compensation of temperature-drift errors in fundamental-mode orthogonal fluxgates. In IMTC'06 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference (pp. 1201-1204). [1700368] https://doi.org/10.1109/IMTC.2006.235514