Compensation of temperature-drift errors in fundamental-mode orthogonal fluxgates

Anton Plotkin; Eugene Paperno; Alexander Samohin; Ichiro Sasada

doi:10.1109/IMTC.2006.235514

Compensation of temperature-drift errors in fundamental-mode orthogonal fluxgates

Anton Plotkin, Eugene Paperno, Alexander Samohin, Ichiro Sasada

Electrical Engineering Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

A new method for the temperature-compensation of fundamental-mode orthogonal fl uxgates that does not require additional hardware has been proposed and implemented. The method is based on the employme nt of one of the two fluxgate transfer characteristics and the ph ase of the corresponding output signal. The measurement accordin g to the proposed method can be done during a single, unipolar eye le of the flu xgate excitation. This doubles the me asurement update rate compared to conventional methods. The proposed method reduces temperaturedrift errors by an order of magnitude. The fluxgate prototype has demonstrated a 20-fold (down to 100 ppm/°C) reduction of the temperature-drift errors.

Original language	English
Title of host publication	IMTC'06 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
Pages	1201-1204
Number of pages	4
DOIs	https://doi.org/10.1109/IMTC.2006.235514
Publication status	Published - 2006
Event	IMTC'06 - IEEE Instrumentation and Measurement Technology Conference - Sorrento, Italy Duration: Apr 24 2006 → Apr 27 2006

Publication series

Name	Conference Record - IEEE Instrumentation and Measurement Technology Conference
ISSN (Print)	1091-5281

Other

Other	IMTC'06 - IEEE Instrumentation and Measurement Technology Conference
Country/Territory	Italy
City	Sorrento
Period	4/24/06 → 4/27/06

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

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10.1109/IMTC.2006.235514

Cite this

Plotkin, A., Paperno, E., Samohin, A., & Sasada, I. (2006). Compensation of temperature-drift errors in fundamental-mode orthogonal fluxgates. In IMTC'06 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference (pp. 1201-1204). [1700368] (Conference Record - IEEE Instrumentation and Measurement Technology Conference). https://doi.org/10.1109/IMTC.2006.235514

Compensation of temperature-drift errors in fundamental-mode orthogonal fluxgates. / Plotkin, Anton; Paperno, Eugene; Samohin, Alexander et al.
IMTC'06 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference. 2006. p. 1201-1204 1700368 (Conference Record - IEEE Instrumentation and Measurement Technology Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Plotkin, A, Paperno, E, Samohin, A & Sasada, I 2006, Compensation of temperature-drift errors in fundamental-mode orthogonal fluxgates. in IMTC'06 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference., 1700368, Conference Record - IEEE Instrumentation and Measurement Technology Conference, pp. 1201-1204, IMTC'06 - IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 4/24/06. https://doi.org/10.1109/IMTC.2006.235514

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abstract = "A new method for the temperature-compensation of fundamental-mode orthogonal fl uxgates that does not require additional hardware has been proposed and implemented. The method is based on the employme nt of one of the two fluxgate transfer characteristics and the ph ase of the corresponding output signal. The measurement accordin g to the proposed method can be done during a single, unipolar eye le of the flu xgate excitation. This doubles the me asurement update rate compared to conventional methods. The proposed method reduces temperaturedrift errors by an order of magnitude. The fluxgate prototype has demonstrated a 20-fold (down to 100 ppm/°C) reduction of the temperature-drift errors.",

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AB - A new method for the temperature-compensation of fundamental-mode orthogonal fl uxgates that does not require additional hardware has been proposed and implemented. The method is based on the employme nt of one of the two fluxgate transfer characteristics and the ph ase of the corresponding output signal. The measurement accordin g to the proposed method can be done during a single, unipolar eye le of the flu xgate excitation. This doubles the me asurement update rate compared to conventional methods. The proposed method reduces temperaturedrift errors by an order of magnitude. The fluxgate prototype has demonstrated a 20-fold (down to 100 ppm/°C) reduction of the temperature-drift errors.

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Compensation of temperature-drift errors in fundamental-mode orthogonal fluxgates

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