Computer-assisted extrapolation method for absorption correction in quantitative X-ray microanalysis

Z. Horita, M. R. McCartney, J. K. Weiss

    Research output: Contribution to journalLetterpeer-review

    8 Citations (Scopus)

    Abstract

    This letter presents results of rapid processing for X-ray absorption correction in quantitative X-ray microanalysis using an analytical electron microscope. A computer-based system developed for analytical electron microscopy is used to assist in the extrapolation method, which does not require thickness measurement but only the recording of characteristic X-rays for absorption correction.

    Original languageEnglish
    Pages (from-to)263-265
    Number of pages3
    JournalUltramicroscopy
    Volume45
    Issue number2
    DOIs
    Publication statusPublished - Sep 1992

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Instrumentation

    Fingerprint

    Dive into the research topics of 'Computer-assisted extrapolation method for absorption correction in quantitative X-ray microanalysis'. Together they form a unique fingerprint.

    Cite this