Coordinate measurement of micro groove on MEMS device by optically controlled microprobe

Mitsutoshi Kobayashi, Masaki Michihata, Terutake Hayashi, Yasuhiro Takaya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recently, ultra-high accuracy coordinate measuring m achine (Nano-CMM) is demanded for inspecting 3D shapes of micro components. The most important element to achieve the Nano-CMM is the probe for sensing surfaces of 3D components. In this study, laser trapping probe, which is the micro-sphere trapped in air by optical radiation pressures, is proposed as a novel probe. In this paper, micro-groove structure on micro electromechanical system (MEMS) device is measured by using laser trapping probe with circular motion, which is improved to have same sensing property by use of the element of radial polarization. The probe has a diameter of 8 μm while conventional micro probes have a diameter of several tens of μm. The small probe makes it possible to measure narrow space of 50 μm. Moreover, the probe enables to measure specimen regardless of the approaching direction. This shows the potential that laser trapping probe enables to measure any micro structure with same manner. Although there are some conjectures to resolve, it seems that the laser trapping probe is validity as a probe for Nano-CMM.

Original languageEnglish
Title of host publication2010 International Symposium on Optomechatronic Technologies, ISOT 2010
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event2010 International Symposium on Optomechatronic Technologies, ISOT 2010 - Toronto, ON, Canada
Duration: Oct 25 2010Oct 27 2010

Other

Other2010 International Symposium on Optomechatronic Technologies, ISOT 2010
CountryCanada
CityToronto, ON
Period10/25/1010/27/10

Fingerprint

MEMS
Coordinate measuring machines
Lasers
Polarization
Radiation
Microstructure
Air

All Science Journal Classification (ASJC) codes

  • Mechanical Engineering

Cite this

Kobayashi, M., Michihata, M., Hayashi, T., & Takaya, Y. (2010). Coordinate measurement of micro groove on MEMS device by optically controlled microprobe. In 2010 International Symposium on Optomechatronic Technologies, ISOT 2010 [5687360] https://doi.org/10.1109/ISOT.2010.5687360

Coordinate measurement of micro groove on MEMS device by optically controlled microprobe. / Kobayashi, Mitsutoshi; Michihata, Masaki; Hayashi, Terutake; Takaya, Yasuhiro.

2010 International Symposium on Optomechatronic Technologies, ISOT 2010. 2010. 5687360.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kobayashi, M, Michihata, M, Hayashi, T & Takaya, Y 2010, Coordinate measurement of micro groove on MEMS device by optically controlled microprobe. in 2010 International Symposium on Optomechatronic Technologies, ISOT 2010., 5687360, 2010 International Symposium on Optomechatronic Technologies, ISOT 2010, Toronto, ON, Canada, 10/25/10. https://doi.org/10.1109/ISOT.2010.5687360
Kobayashi M, Michihata M, Hayashi T, Takaya Y. Coordinate measurement of micro groove on MEMS device by optically controlled microprobe. In 2010 International Symposium on Optomechatronic Technologies, ISOT 2010. 2010. 5687360 https://doi.org/10.1109/ISOT.2010.5687360
Kobayashi, Mitsutoshi ; Michihata, Masaki ; Hayashi, Terutake ; Takaya, Yasuhiro. / Coordinate measurement of micro groove on MEMS device by optically controlled microprobe. 2010 International Symposium on Optomechatronic Technologies, ISOT 2010. 2010.
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