Correlation between intrinsic defects and electrical properties in the high-quality Cu2ZnSnS4 single crystal

Akira Nagaoka, Hideto Miyake, Tomoyasu Taniyama, Koichi Kakimoto, Kenji Yoshino

Research output: Contribution to journalArticlepeer-review

59 Citations (Scopus)

Fingerprint Dive into the research topics of 'Correlation between intrinsic defects and electrical properties in the high-quality Cu<sub>2</sub>ZnSnS<sub>4</sub> single crystal'. Together they form a unique fingerprint.

Physics & Astronomy